Oblique incidence ellipsometric characterization and the substrate dependence of visible frequency fishnet metamaterials

Thomas W.H. Oates; Babak Dastmalchi; Goran Isic; Sajjad Tollabimazraehno; Christian Helgert; Thomas Pertsch; Ernst Bernhard Kley; Marc A. Verschuuren; Iris Bergmair; Kurt Hingerl; Karsten Hinrichs

doi:10.1364/OE.20.011166

Oblique incidence ellipsometric characterization and the substrate dependence of visible frequency fishnet metamaterials

Thomas W.H. Oates^*, Babak Dastmalchi, Goran Isic, Sajjad Tollabimazraehno, Christian Helgert, Thomas Pertsch, Ernst Bernhard Kley, Marc A. Verschuuren, Iris Bergmair, Kurt Hingerl, Karsten Hinrichs

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

15 Citations (Scopus)

Abstract

We use spectroscopic ellipsometry to investigate the angular-dependent optical modes of fishnet metamaterials fabricated by nanoimprint lithography. Spectroscopic ellipsometry is demonstrated as a fast and efficient method for metamaterial characterization and the measured polarization ratios significantly simplify the calibration procedures compared to reflectance and transmittance measurements. We show that the modes can be well identified by a combination of comparing different substrates and considering the angular dependence of the Wood's anomalies. The lack of angular dispersion of the anti-symmetric gap-modes does not agree with the model and requires further theoretical investigation.

Original language	English
Pages (from-to)	11166-11177
Number of pages	12
Journal	Optics Express
Volume	20
Issue number	10
DOIs	https://doi.org/10.1364/OE.20.011166
Publication status	Published - 7 May 2012

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title = "Oblique incidence ellipsometric characterization and the substrate dependence of visible frequency fishnet metamaterials",

abstract = "We use spectroscopic ellipsometry to investigate the angular-dependent optical modes of fishnet metamaterials fabricated by nanoimprint lithography. Spectroscopic ellipsometry is demonstrated as a fast and efficient method for metamaterial characterization and the measured polarization ratios significantly simplify the calibration procedures compared to reflectance and transmittance measurements. We show that the modes can be well identified by a combination of comparing different substrates and considering the angular dependence of the Wood's anomalies. The lack of angular dispersion of the anti-symmetric gap-modes does not agree with the model and requires further theoretical investigation.",

author = "Oates, {Thomas W.H.} and Babak Dastmalchi and Goran Isic and Sajjad Tollabimazraehno and Christian Helgert and Thomas Pertsch and Kley, {Ernst Bernhard} and Verschuuren, {Marc A.} and Iris Bergmair and Kurt Hingerl and Karsten Hinrichs",

year = "2012",

month = may,

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T1 - Oblique incidence ellipsometric characterization and the substrate dependence of visible frequency fishnet metamaterials

AU - Oates, Thomas W.H.

AU - Dastmalchi, Babak

AU - Isic, Goran

AU - Tollabimazraehno, Sajjad

AU - Helgert, Christian

AU - Pertsch, Thomas

AU - Kley, Ernst Bernhard

AU - Verschuuren, Marc A.

AU - Bergmair, Iris

AU - Hingerl, Kurt

AU - Hinrichs, Karsten

PY - 2012/5/7

Y1 - 2012/5/7

N2 - We use spectroscopic ellipsometry to investigate the angular-dependent optical modes of fishnet metamaterials fabricated by nanoimprint lithography. Spectroscopic ellipsometry is demonstrated as a fast and efficient method for metamaterial characterization and the measured polarization ratios significantly simplify the calibration procedures compared to reflectance and transmittance measurements. We show that the modes can be well identified by a combination of comparing different substrates and considering the angular dependence of the Wood's anomalies. The lack of angular dispersion of the anti-symmetric gap-modes does not agree with the model and requires further theoretical investigation.

AB - We use spectroscopic ellipsometry to investigate the angular-dependent optical modes of fishnet metamaterials fabricated by nanoimprint lithography. Spectroscopic ellipsometry is demonstrated as a fast and efficient method for metamaterial characterization and the measured polarization ratios significantly simplify the calibration procedures compared to reflectance and transmittance measurements. We show that the modes can be well identified by a combination of comparing different substrates and considering the angular dependence of the Wood's anomalies. The lack of angular dispersion of the anti-symmetric gap-modes does not agree with the model and requires further theoretical investigation.

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U2 - 10.1364/OE.20.011166

DO - 10.1364/OE.20.011166

M3 - Article

SN - 1094-4087

VL - 20

SP - 11166

EP - 11177

JO - Optics Express

JF - Optics Express

IS - 10

ER -

Oblique incidence ellipsometric characterization and the substrate dependence of visible frequency fishnet metamaterials

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