Observation of hexagonal crystalline diffraction from growing silicate films

Stephen A. Holt; Garry J. Foran; John W. White

doi:10.1021/la981390u

Observation of hexagonal crystalline diffraction from growing silicate films

Stephen A. Holt, Garry J. Foran, John W. White

Research output: Contribution to journal › Article › peer-review

33 Citations (Scopus)

Abstract

Clear evidence for hexagonal crystallinity in surfactant-templated silicate films growing at the air-water interface is presented for the first time. Grazing incidence synchrotron radiation diffraction shows the development of diffraction spots just as the `induction phase', identified previously, is completed. The observed hexagonal diffraction represents the in-plane ordering of the first two-three layers of film formed at the interface.

Original language	English
Pages (from-to)	2540-2542
Number of pages	3
Journal	Langmuir
Volume	15
Issue number	7
DOIs	https://doi.org/10.1021/la981390u
Publication status	Published - 30 Mar 1999

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title = "Observation of hexagonal crystalline diffraction from growing silicate films",

abstract = "Clear evidence for hexagonal crystallinity in surfactant-templated silicate films growing at the air-water interface is presented for the first time. Grazing incidence synchrotron radiation diffraction shows the development of diffraction spots just as the `induction phase', identified previously, is completed. The observed hexagonal diffraction represents the in-plane ordering of the first two-three layers of film formed at the interface.",

author = "Holt, {Stephen A.} and Foran, {Garry J.} and White, {John W.}",

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AU - White, John W.

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N2 - Clear evidence for hexagonal crystallinity in surfactant-templated silicate films growing at the air-water interface is presented for the first time. Grazing incidence synchrotron radiation diffraction shows the development of diffraction spots just as the `induction phase', identified previously, is completed. The observed hexagonal diffraction represents the in-plane ordering of the first two-three layers of film formed at the interface.

AB - Clear evidence for hexagonal crystallinity in surfactant-templated silicate films growing at the air-water interface is presented for the first time. Grazing incidence synchrotron radiation diffraction shows the development of diffraction spots just as the `induction phase', identified previously, is completed. The observed hexagonal diffraction represents the in-plane ordering of the first two-three layers of film formed at the interface.

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U2 - 10.1021/la981390u

DO - 10.1021/la981390u

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VL - 15

SP - 2540

EP - 2542

JO - Langmuir

JF - Langmuir

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Observation of hexagonal crystalline diffraction from growing silicate films

Abstract

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