Observation of photobleaching in Ge-deficient Ge16.8Se83.2 chalcogenide thin film with prolonged irradiation

Sen Zhang, Yimin Chen, Rongping Wang*, Xiang Shen, Shixun Dai

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    22 Citations (Scopus)

    Abstract

    We presented the unusual result of photobleaching (PB) in Ge-deficient Ge16.8Se83.2 thin films with continuous irradiation with 560 nm laser for 12000 s, which is contradicted with the previous reports that the PB only occurs in GexSe100-x films with x > 30. Observation of the dynamics variations of the photo-induced effects indicated that, photodarkening (PD) appears almost instantaneously upon light irradiation, saturates faster in a shorter time scale, and then photobleaching (PB) becomes dominant. Moreover, both PD and PB process accelerates with increasing irradiation power density. Raman spectra provided the evidence on the change of the photostructure of the samples, e.g. the structural transformation from Ge(Se1/2)4 edge-sharing (ES) to corner-sharing (CS) tetrahedral and homopolar Ge-Ge and Se-Se bonds to heteropolar Ge-Se bonds.

    Original languageEnglish
    Article number14585
    JournalScientific Reports
    Volume7
    Issue number1
    DOIs
    Publication statusPublished - 1 Dec 2017

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