Skip to main navigation Skip to search Skip to main content

On the Angular Dependence of Profile Broadening in Silicon Under Oxygen and Nitrogen Bombardment

Mladen Petravic, Prakash Deenapanray, Caroline Demangel, D-S Moon

    Research output: Chapter in Book/Report/Conference proceedingConference Paperpeer-review

    Original languageEnglish
    Title of host publicationProceedings of the 12th International Conference on Secondary Ion Mass Spetrometry
    EditorsBenninghoven, A.; Bertrand, P.; Migeon, H.N.; Werner, H.W.
    Place of PublicationAmsterdam
    PublisherElsevier
    Pages545-548
    EditionPeer Reviewed
    ISBN (Print)0444503234
    Publication statusPublished - 2000
    EventSecondary Ion Mass Spectrometry (SIMS 1999) - Brussels Belgium
    Duration: 1 Jan 2000 → …

    Conference

    ConferenceSecondary Ion Mass Spectrometry (SIMS 1999)
    Period1/01/00 → …
    OtherMay 9 1999

    Cite this