TY - GEN
T1 - On the performance of an MPC controller including a Notch filter for an AFM
AU - Rana, M. S.
AU - Pota, H. R.
AU - Petersen, I. R.
PY - 2013
Y1 - 2013
N2 - The imaging performance of an atomic force microscope (AFM) at high scanning speeds is limited due to the nonlinear behavior of its scanning unit; i.e., the piezoelectric tube scanner (PTS). In order to increase the imaging speed of the AFM, a model predictive control (MPC) scheme is applied in both the X and Y piezo axes of the PTS to reduce its nonlinearity effects and a modified MPC-Notch scheme is used to improve in damping of the resonant mode. In order to verify the performance improvement achieved by the proposed schemes, scanned images from them, the existing AFM proportionalintegral (PI) controller, and an open-loop AFM system are compared.
AB - The imaging performance of an atomic force microscope (AFM) at high scanning speeds is limited due to the nonlinear behavior of its scanning unit; i.e., the piezoelectric tube scanner (PTS). In order to increase the imaging speed of the AFM, a model predictive control (MPC) scheme is applied in both the X and Y piezo axes of the PTS to reduce its nonlinearity effects and a modified MPC-Notch scheme is used to improve in damping of the resonant mode. In order to verify the performance improvement achieved by the proposed schemes, scanned images from them, the existing AFM proportionalintegral (PI) controller, and an open-loop AFM system are compared.
UR - http://www.scopus.com/inward/record.url?scp=84893223656&partnerID=8YFLogxK
U2 - 10.1109/AUCC.2013.6697321
DO - 10.1109/AUCC.2013.6697321
M3 - Conference contribution
SN - 9781479924981
T3 - 2013 3rd Australian Control Conference, AUCC 2013
SP - 485
EP - 490
BT - 2013 3rd Australian Control Conference, AUCC 2013
T2 - 2013 3rd Australian Control Conference, AUCC 2013
Y2 - 4 November 2013 through 5 November 2013
ER -