Optimal and robust quantum-enhanced metrologywithout echoes

Samuel Nolan*, Simon Haine, Stuart Szigeti

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We show that optimal and robust quantum metrology can be achieved without echoes. Specifically, we explore optimal measurement strategies with and without detection noise, and in both situations, find that echoes are unnecessary.

Original languageEnglish
Title of host publicationQuantum Information and Measurement, QIM 2017
PublisherOptica Publishing Group
ISBN (Print)9781943580262
DOIs
Publication statusPublished - 2017
Externally publishedYes
EventQuantum Information and Measurement, QIM 2017 - Paris, France
Duration: 5 Apr 20177 Apr 2017

Publication series

NameOptics InfoBase Conference Papers
VolumePart F73-QIM 2017
ISSN (Electronic)2162-2701

Conference

ConferenceQuantum Information and Measurement, QIM 2017
Country/TerritoryFrance
CityParis
Period5/04/177/04/17

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