Perimeter recombination characterization by luminescence imaging

Kean Chern Fong; Milan Padilla; Andreas Fell; Evan Franklin; Keith R. Mcintosh; Teng Choon Kho; Andrew W. Blakers; Yona Nebel-Jacobsen; Sachin R. Surve

doi:10.1109/JPHOTOV.2015.2480225

Perimeter recombination characterization by luminescence imaging

Kean Chern Fong^*, Milan Padilla, Andreas Fell, Evan Franklin, Keith R. Mcintosh, Teng Choon Kho, Andrew W. Blakers, Yona Nebel-Jacobsen, Sachin R. Surve

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

15 Citations (Scopus)

Abstract

Perimeter recombination causes significant efficiency loss in solar cells. This paper presents a method to quantify perimeter recombination via luminescence imaging for silicon solar cells embedded within the wafer. The validity of the method is discussed and verified via 2-D semiconductor simulation. We demonstrate the method to be sufficiently sensitive in that it can quantify perimeter recombination even in a solar cell where no obvious deviation from ideality is observed in the current-voltage (J-V) curve.

Original language	English
Article number	7293584
Pages (from-to)	244-251
Number of pages	8
Journal	IEEE Journal of Photovoltaics
Volume	6
Issue number	1
DOIs	https://doi.org/10.1109/JPHOTOV.2015.2480225
Publication status	Published - Jan 2016

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10.1109/JPHOTOV.2015.2480225

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@article{da03d89990ee46ed913b1055e9dc37e8,

title = "Perimeter recombination characterization by luminescence imaging",

abstract = "Perimeter recombination causes significant efficiency loss in solar cells. This paper presents a method to quantify perimeter recombination via luminescence imaging for silicon solar cells embedded within the wafer. The validity of the method is discussed and verified via 2-D semiconductor simulation. We demonstrate the method to be sufficiently sensitive in that it can quantify perimeter recombination even in a solar cell where no obvious deviation from ideality is observed in the current-voltage (J-V) curve.",

keywords = "Characterization, perimeter recombination, photoluminescence, photovoltaic, silicon, simulation",

author = "Fong, {Kean Chern} and Milan Padilla and Andreas Fell and Evan Franklin and Mcintosh, {Keith R.} and Kho, {Teng Choon} and Blakers, {Andrew W.} and Yona Nebel-Jacobsen and Surve, {Sachin R.}",

note = "Publisher Copyright: {\textcopyright} 2011-2012 IEEE.",

year = "2016",

month = jan,

doi = "10.1109/JPHOTOV.2015.2480225",

language = "English",

volume = "6",

pages = "244--251",

journal = "IEEE Journal of Photovoltaics",

issn = "2156-3381",

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TY - JOUR

T1 - Perimeter recombination characterization by luminescence imaging

AU - Fong, Kean Chern

AU - Padilla, Milan

AU - Fell, Andreas

AU - Franklin, Evan

AU - Mcintosh, Keith R.

AU - Kho, Teng Choon

AU - Blakers, Andrew W.

AU - Nebel-Jacobsen, Yona

AU - Surve, Sachin R.

PY - 2016/1

Y1 - 2016/1

N2 - Perimeter recombination causes significant efficiency loss in solar cells. This paper presents a method to quantify perimeter recombination via luminescence imaging for silicon solar cells embedded within the wafer. The validity of the method is discussed and verified via 2-D semiconductor simulation. We demonstrate the method to be sufficiently sensitive in that it can quantify perimeter recombination even in a solar cell where no obvious deviation from ideality is observed in the current-voltage (J-V) curve.

AB - Perimeter recombination causes significant efficiency loss in solar cells. This paper presents a method to quantify perimeter recombination via luminescence imaging for silicon solar cells embedded within the wafer. The validity of the method is discussed and verified via 2-D semiconductor simulation. We demonstrate the method to be sufficiently sensitive in that it can quantify perimeter recombination even in a solar cell where no obvious deviation from ideality is observed in the current-voltage (J-V) curve.

KW - Characterization

KW - perimeter recombination

KW - photoluminescence

KW - photovoltaic

KW - silicon

KW - simulation

UR - http://www.scopus.com/inward/record.url?scp=84943423617&partnerID=8YFLogxK

U2 - 10.1109/JPHOTOV.2015.2480225

DO - 10.1109/JPHOTOV.2015.2480225

M3 - Article

SN - 2156-3381

VL - 6

SP - 244

EP - 251

JO - IEEE Journal of Photovoltaics

JF - IEEE Journal of Photovoltaics

IS - 1

M1 - 7293584

ER -

Perimeter recombination characterization by luminescence imaging

Abstract

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