Phase-stepping interferometry of GaAs nanowires: Determining nano-wire radius

D. J. Little; R. L. Kuruwita; A. Joyce; Q. Gao; T. Burgess; C. Jagadish; D. M. Kane

doi:10.1063/1.4825153

Phase-stepping interferometry of GaAs nanowires: Determining nano-wire radius

D. J. Little^*, R. L. Kuruwita, A. Joyce, Q. Gao, T. Burgess, C. Jagadish, D. M. Kane

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

6 Citations (Scopus)

Abstract

Phase stepping interferometry is used to measure the size of near-cylindrical nanowires. Nanowires with nominal radii of 25 nm and 50 nm were used to test this by comparing specific measured optical phase profile values with theoretical values calculated using a wave-optic model of the Phase stepping interferometry (PSI) system. Agreement within 10% was found, which enabled nanowire radii to be predicted within 4% of the nominal value. This demonstration highlights the potential capability for phase stepping interferometry to characterize single nanoparticles of known geometry in the optical far-field.

Original language	English
Article number	161107
Journal	Applied Physics Letters
Volume	103
Issue number	16
DOIs	https://doi.org/10.1063/1.4825153
Publication status	Published - 14 Oct 2013

Access to Document

10.1063/1.4825153

Cite this

@article{8f0fe69252734c269e84cc2cb98fa08f,

title = "Phase-stepping interferometry of GaAs nanowires: Determining nano-wire radius",

abstract = "Phase stepping interferometry is used to measure the size of near-cylindrical nanowires. Nanowires with nominal radii of 25 nm and 50 nm were used to test this by comparing specific measured optical phase profile values with theoretical values calculated using a wave-optic model of the Phase stepping interferometry (PSI) system. Agreement within 10% was found, which enabled nanowire radii to be predicted within 4% of the nominal value. This demonstration highlights the potential capability for phase stepping interferometry to characterize single nanoparticles of known geometry in the optical far-field.",

author = "Little, {D. J.} and Kuruwita, {R. L.} and A. Joyce and Q. Gao and T. Burgess and C. Jagadish and Kane, {D. M.}",

year = "2013",

month = oct,

day = "14",

doi = "10.1063/1.4825153",

language = "English",

volume = "103",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "16",

}

TY - JOUR

T1 - Phase-stepping interferometry of GaAs nanowires

T2 - Determining nano-wire radius

AU - Little, D. J.

AU - Kuruwita, R. L.

AU - Joyce, A.

AU - Gao, Q.

AU - Burgess, T.

AU - Jagadish, C.

AU - Kane, D. M.

PY - 2013/10/14

Y1 - 2013/10/14

N2 - Phase stepping interferometry is used to measure the size of near-cylindrical nanowires. Nanowires with nominal radii of 25 nm and 50 nm were used to test this by comparing specific measured optical phase profile values with theoretical values calculated using a wave-optic model of the Phase stepping interferometry (PSI) system. Agreement within 10% was found, which enabled nanowire radii to be predicted within 4% of the nominal value. This demonstration highlights the potential capability for phase stepping interferometry to characterize single nanoparticles of known geometry in the optical far-field.

AB - Phase stepping interferometry is used to measure the size of near-cylindrical nanowires. Nanowires with nominal radii of 25 nm and 50 nm were used to test this by comparing specific measured optical phase profile values with theoretical values calculated using a wave-optic model of the Phase stepping interferometry (PSI) system. Agreement within 10% was found, which enabled nanowire radii to be predicted within 4% of the nominal value. This demonstration highlights the potential capability for phase stepping interferometry to characterize single nanoparticles of known geometry in the optical far-field.

UR - http://www.scopus.com/inward/record.url?scp=84886398906&partnerID=8YFLogxK

U2 - 10.1063/1.4825153

DO - 10.1063/1.4825153

M3 - Article

SN - 0003-6951

VL - 103

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 16

M1 - 161107

ER -

Phase-stepping interferometry of GaAs nanowires: Determining nano-wire radius

Abstract

Access to Document

Other files and links

Fingerprint

Cite this