Photodetachment of O- from threshold to 1.2 eV electron kinetic energy using velocity-map imaging

S. J. Cavanagh, S. T. Gibson, B. R. Lewis

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    7 Citations (Scopus)

    Abstract

    High-resolution photoelectron imaging from O- with excess energies between 0.5 meV and 1.2 eV is reported. With electron energy resolutions ranging from 266 μeV to 3 meV, branching ratios and angular-distribution asymmetry parameters for each of the fine-structure transitions were measured. Preliminary data for a subset of these measurements showing possible effects due to electron correlation at low excess energy are presented, in the hope of stimulating further theoretical calculations for this species.

    Original languageEnglish
    Article number012034
    JournalJournal of Physics: Conference Series
    Volume212
    DOIs
    Publication statusPublished - 2010

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