Abstract
We report the properties of thermally evaporated Ge11.5As24Se64.5 chalcogenide films ion implanted at energies of 2.25MeV with Erbium at concentrations up to 0.4 mol%. The effect of post implant annealing on the refractive index of the films and on the 4I13/2→ 4I15/2 Er transition was studied. Photoluminescence was found to increase significantly and a lifetime of 1.35 ms was obtained in films annealed at 180oC. Different apparent lifetimes for the 4I13/2→ 4I15/2 transition were obtained for 980nm and 1470nm pumps and the origins of this phenomenon are discussed.
Original language | English |
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Pages (from-to) | 1270-1277 |
Number of pages | 8 |
Journal | Optical Materials Express |
Volume | 2 |
Issue number | 9 |
DOIs | |
Publication status | Published - Sept 2012 |