PIXE measurements of Renaissance silverpoint drawings at VERA

Petra Milota, Ina Reiche, Alain Duval, Oliver Forstner, Hélène Guicharnaud, Walter Kutschera, Silke Merchel, Alfred Priller, Manfred Schreiner, Peter Steier, Elisabeth Thobois, Anton Wallner, Barbara Wünschek, Robin Golser*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

16 Citations (Scopus)

Abstract

Silverpoint drawings from the Renaissance are among the most precious and rarest treasures of graphical art. Our research group is particularly interested in the analysis of silverpoint drawings by Albrecht Dürer (1471-1528). A very sensitive and non-destructive analytical method, either spatially resolved synchrotron-radiation induced X-ray fluorescence (SY-XRF) or proton-induced X-ray emission (PIXE), is needed to determine the chemical composition of the very faint silver marks on such drawings. Dürer drawings from the collection of the Albertina, Vienna, were analyzed to amend existing data on Dürer drawings. For this purpose an external-beam PIXE setup was installed at the Vienna Environmental Research Accelerator (VERA). It allows to analyze a spot of ∼0.15 mm on the object in air with 3 MeV protons, and to detect the emitted X-rays that are characteristic for the chemical composition with very good sensitivity and without harming the precious objects. After successful measurements on artificial test samples, four original silverpoint drawings were investigated: two portraits from Albrecht Dürer's very early period (self-portrait and portrait of his father) and two drawings from Dürer's sketch book of his travel to the Netherlands 1520/21.

Original languageEnglish
Pages (from-to)2279-2285
Number of pages7
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume266
Issue number10
DOIs
Publication statusPublished - May 2008
Externally publishedYes

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