Plasma ionization in low-pressure radio-frequency discharges - Part II: Particle-in-cell simulation

A. Meige*, D. O'Connell, T. Gans, R. W. Boswell

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    16 Citations (Scopus)

    Abstract

    Plasma ionization in the low-pressure operation regime (< 5 Pa) of RF capacitively coupled plasmas (CCPs) is governed by a complex interplay of various mechanisms, such as field reversal, sheath expansion, and wave-particle interactions. In a previous paper, it was shown that experimental observations in a hydrogen CCP operated at 13.56 MHz are qualitatively well described in a 1-D symmetrical particle-in-cell (PIC) simulation. In this paper, a spherical asymmetrical PIC simulation that is closer to the conditions of the highly asymmetrical experimental device is used to simulate a low-pressure neon CCP operated at 2 MHz. The results show a similar behavior, with pronounced ionization through field reversal, sheath expansion, and wave-particle interactions, and can be exploited for more accurate quantitative comparisons with experimental observations.

    Original languageEnglish
    Pages (from-to)1384-1385
    Number of pages2
    JournalIEEE Transactions on Plasma Science
    Volume36
    Issue number4 PART 1
    DOIs
    Publication statusPublished - Aug 2008

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