Preferential amorphization and defect annihilation at nanocavities in silicon during ion irradiation

J. S. Williams*, Xianfang Zhu, M. C. Ridgway, M. J. Conway, B. C. Williams, F. Fortuna, M. O. Ruault, H. Bernas

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    34 Citations (Scopus)

    Abstract

    Si containing a band of nanocavities has been irradiated with Si+ ions at elevated temperatures to study interactions of irradiation-induced defects with open volume defects. For irradiation at 100°C, nanocavities are shown to be preferential nucleation sites for amorphization. It is proposed that this behavior occurs to minimize the local free energy, whereby less dense amorphous Si is free to expand into the cavity open volume. Furthermore, for irradiation at 300°C, cavities are very efficient sinks for Si interstitials during irradiation, leaving a region denuded of interstitial-based clusters surrounding each nanocavity.

    Original languageEnglish
    Pages (from-to)4280-4282
    Number of pages3
    JournalApplied Physics Letters
    Volume77
    Issue number26
    DOIs
    Publication statusPublished - 25 Dec 2000

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