Preferential amorphization and defect annihilation at nanocavities in silicon during ion irradiation

J. S. Williams*, Xianfang Zhu, M. C. Ridgway, M. J. Conway, B. C. Williams, F. Fortuna, M. O. Ruault, H. Bernas

*Corresponding author for this work

    Research output: Contribution to journal › Article › peer-review

    34 Citations (Scopus)

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