Abstract
Zinc Oxide (ZnO) films were deposited onto etched and unetched glass substrates using RF sputtering technique. Highly oriented ZnO thin films were successfully prepared on glass substrates under an optimized sputtering condition. It was found that the substrate etching greatly enhanced the film crystallinity and adherent strength of the ZnO thin films on glass substrates. In photoluminescence (PL) studies at room temperature for wavelengths between 350nm and 640nm, we have observed a single exciton peak around 380nm and a very weak deep-level emission indicating that the concentration of defects responsible for the deep-level emission is low. X-ray diffraction, SEM and a Scratch Adhesion Tester were used to examine the film crystallinity and adhesion on the etched and unetched glass substrates.
Original language | English |
---|---|
Pages (from-to) | 193-198 |
Number of pages | 6 |
Journal | Key Engineering Materials |
Volume | 214-215 |
Publication status | Published - 2002 |
Externally published | Yes |
Event | 1st Asian Meeting of Electroceramics - Kawasaki, Japan Duration: 26 Oct 2000 → 27 Oct 2000 |