Preparation and characteristics of ZnO thin films deposited on glass substrates

O. Agyeman, C. N. Xu, Y. Liu, M. Akiyama, X. G. Zheng*, M. Suzuki, T. Harada

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

4 Citations (Scopus)

Abstract

Zinc Oxide (ZnO) films were deposited onto etched and unetched glass substrates using RF sputtering technique. Highly oriented ZnO thin films were successfully prepared on glass substrates under an optimized sputtering condition. It was found that the substrate etching greatly enhanced the film crystallinity and adherent strength of the ZnO thin films on glass substrates. In photoluminescence (PL) studies at room temperature for wavelengths between 350nm and 640nm, we have observed a single exciton peak around 380nm and a very weak deep-level emission indicating that the concentration of defects responsible for the deep-level emission is low. X-ray diffraction, SEM and a Scratch Adhesion Tester were used to examine the film crystallinity and adhesion on the etched and unetched glass substrates.

Original languageEnglish
Pages (from-to)193-198
Number of pages6
JournalKey Engineering Materials
Volume214-215
Publication statusPublished - 2002
Externally publishedYes
Event1st Asian Meeting of Electroceramics - Kawasaki, Japan
Duration: 26 Oct 200027 Oct 2000

Fingerprint

Dive into the research topics of 'Preparation and characteristics of ZnO thin films deposited on glass substrates'. Together they form a unique fingerprint.

Cite this