Preparation and characterization of 33S samples for 33S(n,α)30Si cross-section measurements at the n_TOF facility at CERN

    Research output: Contribution to journal › Article › peer-review

    4 Citations (Scopus)

    Fingerprint

    Dive into the research topics of 'Preparation and characterization of 33S samples for 33S(n,α)30Si cross-section measurements at the n_TOF facility at CERN'. Together they form a unique fingerprint.

    Physics

    Material Science

    Chemistry