Probing 5f -state configurations in URu2Si2 with U LIII -edge resonant x-ray emission spectroscopy

C. H. Booth; S. A. Medling; J. G. Tobin; R. E. Baumbach; E. D. Bauer; D. Sokaras; D. Nordlund; T. C. Weng

doi:10.1103/PhysRevB.94.045121

Probing 5f -state configurations in URu2Si2 with U LIII -edge resonant x-ray emission spectroscopy

C. H. Booth
, S. A. Medling
, J. G. Tobin
, R. E. Baumbach
, E. D. Bauer
, D. Sokaras
, D. Nordlund
, T. C. Weng

Research output: Contribution to journal › Article › peer-review

34 Citations (Scopus)

Abstract

Resonant x-ray emission spectroscopy (RXES) was employed at the U LIII absorption edge and the Lα1 emission line to explore the 5f occupancy, nf, and the degree of 5f-orbital delocalization in the hidden-order compound URu2Si2. By comparing to suitable reference materials such as UF4, UCd11, and α-U, we conclude that the 5f orbital in URu2Si2 is at least partially delocalized with nf=2.87±0.08, and does not change with temperature down to 10 K within the estimated error. These results place further constraints on theoretical explanations of the hidden order, especially those requiring a localized f2 ground state.

Original language	English
Article number	045121
Journal	Physical Review B
Volume	94
Issue number	4
DOIs	https://doi.org/10.1103/PhysRevB.94.045121
Publication status	Published - 15 Jul 2016

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title = "Probing 5f -state configurations in URu2Si2 with U LIII -edge resonant x-ray emission spectroscopy",

abstract = "Resonant x-ray emission spectroscopy (RXES) was employed at the U LIII absorption edge and the Lα1 emission line to explore the 5f occupancy, nf, and the degree of 5f-orbital delocalization in the hidden-order compound URu2Si2. By comparing to suitable reference materials such as UF4, UCd11, and α-U, we conclude that the 5f orbital in URu2Si2 is at least partially delocalized with nf=2.87±0.08, and does not change with temperature down to 10 K within the estimated error. These results place further constraints on theoretical explanations of the hidden order, especially those requiring a localized f2 ground state.",

author = "Booth, \{C. H.\} and Medling, \{S. A.\} and Tobin, \{J. G.\} and Baumbach, \{R. E.\} and Bauer, \{E. D.\} and D. Sokaras and D. Nordlund and Weng, \{T. C.\}",

note = "Publisher Copyright: {\textcopyright} 2016 American Physical Society.",

year = "2016",

month = jul,

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doi = "10.1103/PhysRevB.94.045121",

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TY - JOUR

T1 - Probing 5f -state configurations in URu2Si2 with U LIII -edge resonant x-ray emission spectroscopy

AU - Booth, C. H.

AU - Medling, S. A.

AU - Tobin, J. G.

AU - Baumbach, R. E.

AU - Bauer, E. D.

AU - Sokaras, D.

AU - Nordlund, D.

AU - Weng, T. C.

PY - 2016/7/15

Y1 - 2016/7/15

N2 - Resonant x-ray emission spectroscopy (RXES) was employed at the U LIII absorption edge and the Lα1 emission line to explore the 5f occupancy, nf, and the degree of 5f-orbital delocalization in the hidden-order compound URu2Si2. By comparing to suitable reference materials such as UF4, UCd11, and α-U, we conclude that the 5f orbital in URu2Si2 is at least partially delocalized with nf=2.87±0.08, and does not change with temperature down to 10 K within the estimated error. These results place further constraints on theoretical explanations of the hidden order, especially those requiring a localized f2 ground state.

AB - Resonant x-ray emission spectroscopy (RXES) was employed at the U LIII absorption edge and the Lα1 emission line to explore the 5f occupancy, nf, and the degree of 5f-orbital delocalization in the hidden-order compound URu2Si2. By comparing to suitable reference materials such as UF4, UCd11, and α-U, we conclude that the 5f orbital in URu2Si2 is at least partially delocalized with nf=2.87±0.08, and does not change with temperature down to 10 K within the estimated error. These results place further constraints on theoretical explanations of the hidden order, especially those requiring a localized f2 ground state.

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U2 - 10.1103/PhysRevB.94.045121

DO - 10.1103/PhysRevB.94.045121

M3 - Article

SN - 2469-9950

VL - 94

JO - Physical Review B

JF - Physical Review B

IS - 4

M1 - 045121

ER -

Probing 5f -state configurations in URu2Si2 with U LIII -edge resonant x-ray emission spectroscopy

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