Pump-Probe Measurements using Silicon Nanocrystal Waveguides

Nathanael Smith*, Max J. Lederer, Marek Samoc, Barry Luther-Davies, Robert G. Elliman

*Corresponding author for this work

    Research output: Contribution to journalConference articlepeer-review

    1 Citation (Scopus)

    Abstract

    Optical pump-probe measurements were performed on planar slab waveguides containing silicon nanocrystals in an attempt to measure optical gain from photo-excited silicon nanocrystals. Two experiments were performed, one with a continuous-wave probe beam and a pulsed pump beam, giving a time resolution of approximately 25 ns, and the other with a pulsed pump and probe beam, giving a time resolution of approximately 10 ps. In both cases the intensity of the probe beam was found to be attenuated by the pump beam, with the attenuation increasing monotonically with increasing pump power. Time-resolved measurements using the first experimental arrangement showed that the probe signal recovered its initial intensity on a time scale of 45-70 μs, a value comparable to the exciton lifetime in Si nanocrystals. These data are shown to be consistent with an induced absorption process such as confined carrier absorption. No evidence for optical gain was observed.

    Original languageEnglish
    Pages (from-to)63-68
    Number of pages6
    JournalMaterials Research Society Symposium - Proceedings
    Volume770
    DOIs
    Publication statusPublished - 2003
    EventOptoelectronics of Group-IV-Based Materials - San Francisco, CA, United States
    Duration: 21 Apr 200324 Apr 2003

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