Quantitative analysis of grain boundary recombination in multi-crystalline silicon wafers

A.R. Burgers; Lambert Johan Geerligs; Daniel MacDonald; A Azzizi

Quantitative analysis of grain boundary recombination in multi-crystalline silicon wafers

A.R. Burgers, Lambert Johan Geerligs, Daniel MacDonald, A Azzizi

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › peer-review

Original language	English
Title of host publication	Technical Digest of the International PVSEC-17
Editors	Conference Program Committee
Place of Publication	Netherlands
Publisher	Elsevier
Pages	241-242
Edition	Peer Reviewed
Publication status	Published - 2007
Event	17th International Photovoltaic Science and Engineering Conference 2007 (PVSEC-17) - Fukuoka, Japan Duration: 3 Dec 2007 → 7 Dec 2007 https://www.sciencedirect.com/journal/solar-energy-materials-and-solar-cells/vol/93/issue/6 https://publica.fraunhofer.de/entities/mainwork/4ae4ccb4-2a96-48d5-8bec-23aa4d1ed1f1

Conference

Conference	17th International Photovoltaic Science and Engineering Conference 2007 (PVSEC-17)
Abbreviated title	Int'l PVSEC-17
Country/Territory	Japan
City	Fukuoka
Period	3/12/07 → 7/12/07
Internet address	https://www.sciencedirect.com/journal/solar-energy-materials-and-solar-cells/vol/93/issue/6 https://publica.fraunhofer.de/entities/mainwork/4ae4ccb4-2a96-48d5-8bec-23aa4d1ed1f1

Cite this

@inproceedings{c0a752a5bf49469987b166d254a79366,

title = "Quantitative analysis of grain boundary recombination in multi-crystalline silicon wafers",

author = "A.R. Burgers and Geerligs, {Lambert Johan} and Daniel MacDonald and A Azzizi",

year = "2007",

language = "English",

pages = "241--242",

editor = "{Conference Program Committee}",

booktitle = "Technical Digest of the International PVSEC-17",

publisher = "Elsevier",

edition = "Peer Reviewed",

note = "17th International Photovoltaic Science and Engineering Conference 2007 (PVSEC-17), Int'l PVSEC-17 ; Conference date: 03-12-2007 Through 07-12-2007",

url = "https://www.sciencedirect.com/journal/solar-energy-materials-and-solar-cells/vol/93/issue/6, https://publica.fraunhofer.de/entities/mainwork/4ae4ccb4-2a96-48d5-8bec-23aa4d1ed1f1",

}

Burgers, AR, Geerligs, LJ, MacDonald, D & Azzizi, A 2007, Quantitative analysis of grain boundary recombination in multi-crystalline silicon wafers. in CPC (ed.), Technical Digest of the International PVSEC-17. Peer Reviewed edn, Elsevier, Netherlands, pp. 241-242, 17th International Photovoltaic Science and Engineering Conference 2007 (PVSEC-17), Fukuoka, Japan, 3/12/07.

Quantitative analysis of grain boundary recombination in multi-crystalline silicon wafers. / Burgers, A.R.; Geerligs, Lambert Johan; MacDonald, Daniel et al.
Technical Digest of the International PVSEC-17. ed. / Conference Program Committee. Peer Reviewed. ed. Netherlands: Elsevier, 2007. p. 241-242.

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › peer-review

TY - GEN

T1 - Quantitative analysis of grain boundary recombination in multi-crystalline silicon wafers

AU - Burgers, A.R.

AU - Geerligs, Lambert Johan

AU - MacDonald, Daniel

AU - Azzizi, A

PY - 2007

Y1 - 2007

M3 - Conference Paper

SP - 241

EP - 242

BT - Technical Digest of the International PVSEC-17

A2 - null, Conference Program Committee

PB - Elsevier

CY - Netherlands

T2 - 17th International Photovoltaic Science and Engineering Conference 2007 (PVSEC-17)

Y2 - 3 December 2007 through 7 December 2007

ER -