Quantum Hamiltonian Identifiability via a Similarity Transformation Approach and beyond

Yuanlong Wang, Daoyi Dong*, Akira Sone, Ian R. Petersen, Hidehiro Yonezawa, Paola Cappellaro*

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    33 Citations (Scopus)

    Abstract

    The identifiability of a system is concerned with whether the unknown parameters in the system can be uniquely determined with all the possible data generated by a certain experimental setting. A test of quantum Hamiltonian identifiability is an important tool to save time and cost when exploring the identification capability of quantum probes and experimentally implementing quantum identification schemes. In this article, we generalize the identifiability test based on the similarity transformation approach (STA) in classical control theory and extend it to the domain of quantum Hamiltonian identification. We employ the STA to prove the identifiability of spin-1/2 chain systems with arbitrary dimension assisted by single-qubit probes. We further extend the traditional STA method by proposing a structure preserving transformation (SPT) method for nonminimal systems. We use the SPT method to introduce an indicator for the existence of economic quantum Hamiltonian identification algorithms, whose computational complexity directly depends on the number of unknown parameters (which could be much smaller than the system dimension). Finally, we give an example of such an economic Hamiltonian identification algorithm and perform simulations to demonstrate its effectiveness.

    Original languageEnglish
    Article number9026783
    Pages (from-to)4632-4647
    Number of pages16
    JournalIEEE Transactions on Automatic Control
    Volume65
    Issue number11
    DOIs
    Publication statusPublished - Nov 2020

    Fingerprint

    Dive into the research topics of 'Quantum Hamiltonian Identifiability via a Similarity Transformation Approach and beyond'. Together they form a unique fingerprint.

    Cite this