TY - GEN
T1 - Real image denoising with feature attention
AU - Anwar, Saeed
AU - Barnes, Nick
N1 - Publisher Copyright:
© 2019 IEEE.
PY - 2019/10
Y1 - 2019/10
N2 - Deep convolutional neural networks perform better on images containing spatially invariant noise (synthetic noise); however, its performance is limited on real-noisy photographs and requires multiple stage network modeling. To advance the practicability of the denoising algorithms, this paper proposes a novel single-stage blind real image denoising network (RIDNet) by employing a modular architecture. We use residual on the residual structure to ease the flow of low-frequency information and apply feature attention to exploit the channel dependencies. Furthermore, the evaluation in terms of quantitative metrics and visual quality on three synthetic and four real noisy datasets against 19 state-of-the-art algorithms demonstrate the superiority of our RIDNet.
AB - Deep convolutional neural networks perform better on images containing spatially invariant noise (synthetic noise); however, its performance is limited on real-noisy photographs and requires multiple stage network modeling. To advance the practicability of the denoising algorithms, this paper proposes a novel single-stage blind real image denoising network (RIDNet) by employing a modular architecture. We use residual on the residual structure to ease the flow of low-frequency information and apply feature attention to exploit the channel dependencies. Furthermore, the evaluation in terms of quantitative metrics and visual quality on three synthetic and four real noisy datasets against 19 state-of-the-art algorithms demonstrate the superiority of our RIDNet.
UR - http://www.scopus.com/inward/record.url?scp=85078674247&partnerID=8YFLogxK
U2 - 10.1109/ICCV.2019.00325
DO - 10.1109/ICCV.2019.00325
M3 - Conference contribution
T3 - Proceedings of the IEEE International Conference on Computer Vision
SP - 3155
EP - 3164
BT - Proceedings - 2019 International Conference on Computer Vision, ICCV 2019
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 17th IEEE/CVF International Conference on Computer Vision, ICCV 2019
Y2 - 27 October 2019 through 2 November 2019
ER -