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Reflectance measurements of triangular lattice GaAs nanowire arrays

  • Joona Pekko Kakko
  • , Tuomas Haggrén
  • , Teppo Huhtio
  • , Veer Dhaka
  • , Harri Lipsanen

Research output: Chapter in Book/Report/Conference proceedingConference Paperpeer-review

Abstract

Triangular lattice GaAs nanowires were fabricated using electron beam lithography defined Au arrays and metalorganic vapour phase epitaxy. Reflectance measurements for GaAs NW arrays with varying pitch in a triangular lattice are presented. The measured spectra are compared to the literature data on square lattice NW arrays and selective-area epitaxy grown triangular lattice NW arrays. Reflectance from a triangular lattice NW array is found to have similar characteristics as from a square lattice. Unlike for the square lattice, it is observed that the reflection edge does not depend linearly on the NW diameter with smallest pitches in the triangular lattice and that a Morse potential fit describes the behaviour most closely.

Original languageEnglish
Title of host publicationProceedings of the IEEE Conference on Nanotechnology
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages810-814
Number of pages5
ISBN (Electronic)9781479956227
DOIs
Publication statusPublished - 26 Nov 2014
Externally publishedYes
Event2014 14th IEEE International Conference on Nanotechnology, IEEE-NANO 2014 - Toronto, Canada
Duration: 18 Aug 201421 Aug 2014

Publication series

NameProceedings of the IEEE Conference on Nanotechnology
ISSN (Electronic)1944-9399

Conference

Conference2014 14th IEEE International Conference on Nanotechnology, IEEE-NANO 2014
Country/TerritoryCanada
CityToronto
Period18/08/1421/08/14

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