Relative performance of spiral scan over raster scan in the AFM imaging

M. S. Rana; H. R. Pota; I. R. Petersen

doi:10.1109/CEEE.2015.7428259

Relative performance of spiral scan over raster scan in the AFM imaging

M. S. Rana, H. R. Pota, I. R. Petersen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

In this paper, we first consider the use of a spiral rather than the conventional raster scanning method for improving the imaging performance of an atomic force microscope (AFM). To generate spirals, single-frequency, slowly varying amplitude sine and cosine waves are applied to the X-and Y-piezos, respectively, of the piezoelectric tube scanner (PTS) of an AFM. To demonstrate the performance improvement with the spiral scanning method, a comparison of spiral and raster scanning techniques is presented. In each case, the closed-loop operation is performed using a multi-input multi-output (MIMO) model predictive control (MPC) scheme augmented with a vibration compensator to minimize the tracking error.

Original language	English
Title of host publication	ICEEE 2015 - 1st International Conference on Electrical and Electronic Engineering
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	217-220
Number of pages	4
ISBN (Electronic)	9781509019397
DOIs	https://doi.org/10.1109/CEEE.2015.7428259
Publication status	Published - 7 Mar 2016
Externally published	Yes
Event	1st International Conference on Electrical and Electronic Engineering, ICEEE 2015 - Rajshahi, Bangladesh Duration: 4 Nov 2015 → 6 Nov 2015

Publication series

Name	ICEEE 2015 - 1st International Conference on Electrical and Electronic Engineering

Conference

Conference	1st International Conference on Electrical and Electronic Engineering, ICEEE 2015
Country/Territory	Bangladesh
City	Rajshahi
Period	4/11/15 → 6/11/15

Access to Document

10.1109/CEEE.2015.7428259

Cite this

Rana, M. S., Pota, H. R., & Petersen, I. R. (2016). Relative performance of spiral scan over raster scan in the AFM imaging. In ICEEE 2015 - 1st International Conference on Electrical and Electronic Engineering (pp. 217-220). Article 7428259 (ICEEE 2015 - 1st International Conference on Electrical and Electronic Engineering). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CEEE.2015.7428259

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title = "Relative performance of spiral scan over raster scan in the AFM imaging",

abstract = "In this paper, we first consider the use of a spiral rather than the conventional raster scanning method for improving the imaging performance of an atomic force microscope (AFM). To generate spirals, single-frequency, slowly varying amplitude sine and cosine waves are applied to the X-and Y-piezos, respectively, of the piezoelectric tube scanner (PTS) of an AFM. To demonstrate the performance improvement with the spiral scanning method, a comparison of spiral and raster scanning techniques is presented. In each case, the closed-loop operation is performed using a multi-input multi-output (MIMO) model predictive control (MPC) scheme augmented with a vibration compensator to minimize the tracking error.",

keywords = "Atomic force microscope, model predictive control, piezoelectric tube scanner, raster scan, spiral scan",

author = "Rana, {M. S.} and Pota, {H. R.} and Petersen, {I. R.}",

note = "Publisher Copyright: {\textcopyright} 2015 IEEE.; 1st International Conference on Electrical and Electronic Engineering, ICEEE 2015 ; Conference date: 04-11-2015 Through 06-11-2015",

year = "2016",

month = mar,

day = "7",

doi = "10.1109/CEEE.2015.7428259",

language = "English",

series = "ICEEE 2015 - 1st International Conference on Electrical and Electronic Engineering",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

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Rana, MS, Pota, HR & Petersen, IR 2016, Relative performance of spiral scan over raster scan in the AFM imaging. in ICEEE 2015 - 1st International Conference on Electrical and Electronic Engineering., 7428259, ICEEE 2015 - 1st International Conference on Electrical and Electronic Engineering, Institute of Electrical and Electronics Engineers Inc., pp. 217-220, 1st International Conference on Electrical and Electronic Engineering, ICEEE 2015, Rajshahi, Bangladesh, 4/11/15. https://doi.org/10.1109/CEEE.2015.7428259

Relative performance of spiral scan over raster scan in the AFM imaging. / Rana, M. S.; Pota, H. R.; Petersen, I. R.
ICEEE 2015 - 1st International Conference on Electrical and Electronic Engineering. Institute of Electrical and Electronics Engineers Inc., 2016. p. 217-220 7428259 (ICEEE 2015 - 1st International Conference on Electrical and Electronic Engineering).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Relative performance of spiral scan over raster scan in the AFM imaging

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AU - Pota, H. R.

AU - Petersen, I. R.

PY - 2016/3/7

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N2 - In this paper, we first consider the use of a spiral rather than the conventional raster scanning method for improving the imaging performance of an atomic force microscope (AFM). To generate spirals, single-frequency, slowly varying amplitude sine and cosine waves are applied to the X-and Y-piezos, respectively, of the piezoelectric tube scanner (PTS) of an AFM. To demonstrate the performance improvement with the spiral scanning method, a comparison of spiral and raster scanning techniques is presented. In each case, the closed-loop operation is performed using a multi-input multi-output (MIMO) model predictive control (MPC) scheme augmented with a vibration compensator to minimize the tracking error.

AB - In this paper, we first consider the use of a spiral rather than the conventional raster scanning method for improving the imaging performance of an atomic force microscope (AFM). To generate spirals, single-frequency, slowly varying amplitude sine and cosine waves are applied to the X-and Y-piezos, respectively, of the piezoelectric tube scanner (PTS) of an AFM. To demonstrate the performance improvement with the spiral scanning method, a comparison of spiral and raster scanning techniques is presented. In each case, the closed-loop operation is performed using a multi-input multi-output (MIMO) model predictive control (MPC) scheme augmented with a vibration compensator to minimize the tracking error.

KW - Atomic force microscope

KW - model predictive control

KW - piezoelectric tube scanner

KW - raster scan

KW - spiral scan

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M3 - Conference contribution

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BT - ICEEE 2015 - 1st International Conference on Electrical and Electronic Engineering

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Rana MS, Pota HR, Petersen IR. Relative performance of spiral scan over raster scan in the AFM imaging. In ICEEE 2015 - 1st International Conference on Electrical and Electronic Engineering. Institute of Electrical and Electronics Engineers Inc. 2016. p. 217-220. 7428259. (ICEEE 2015 - 1st International Conference on Electrical and Electronic Engineering). doi: 10.1109/CEEE.2015.7428259

Relative performance of spiral scan over raster scan in the AFM imaging

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