Reliability of NiO/β-Ga2O3 bipolar heterojunction

Hehe Gong*, Xin Yang, Matthew Porter, Zineng Yang, Bixuan Wang, Li Li, Lan Fu, Kohei Sasaki, Han Wang, Shulin Gu, Rong Zhang, Jiandong Ye*, Yuhao Zhang*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

14 Citations (Scopus)

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