@inproceedings{eb47688d53114794b4cc39030a467df0,
title = "Resistive switching in high-k dielectrics for non-volatile memory applications",
abstract = "We review our recent research on resistive switching in transition metal oxides for use as nonvolatile resistive random access memory (ReRAM), including the effect of film microstructure on switching characteristics and new data on metal-bridge memory.",
author = "Elliman, {R. G.} and Saleh, {M. N.} and Venkatachalam, {D. K.} and Kim, {T. H.} and K. Belay and F. Karouta",
year = "2012",
doi = "10.1109/COMMAD.2012.6472390",
language = "English",
isbn = "9781467330459",
series = "Conference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, COMMAD",
pages = "121--122",
booktitle = "2012 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2012 - Proceedings",
note = "2012 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2012 ; Conference date: 12-12-2012 Through 14-12-2012",
}