Resonant control of atomic force microscope scanner: A 'mixed' negative-imaginary and small-gain approach

Sajal K. Das, Hemanshu R. Pota, Ian R. Petersen

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

14 Citations (Scopus)

Abstract

This paper presents the design and implementation of a resonant controller for the piezoelectric tube scanner (PTS) of an atomic force microscope (AFM) to damp the first resonant mode. The dynamics of the PTS is identified by using the measured data and the 'mixed' negative-imaginary and small-gain approach is used to establish the internal stability of the interconnected systems. The experimental results demonstrate the performance improvement achieved by the proposed controller.

Original languageEnglish
Title of host publication2013 American Control Conference, ACC 2013
Pages5476-5481
Number of pages6
Publication statusPublished - 2013
Externally publishedYes
Event2013 1st American Control Conference, ACC 2013 - Washington, DC, United States
Duration: 17 Jun 201319 Jun 2013

Publication series

NameProceedings of the American Control Conference
ISSN (Print)0743-1619

Conference

Conference2013 1st American Control Conference, ACC 2013
Country/TerritoryUnited States
CityWashington, DC
Period17/06/1319/06/13

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