Resonant controller for fast atomic force microscopy

Sajal K. Das; Hemanshu R. Pota; Ian R. Petersen

doi:10.1109/CDC.2012.6426563

Resonant controller for fast atomic force microscopy

Sajal K. Das^*, Hemanshu R. Pota, Ian R. Petersen

^*Corresponding author for this work

Research output: Contribution to journal › Conference article › peer-review

24 Citations (Scopus)

Abstract

The imaging performance of the atomic force microscope (AFM) in higher scanning speed is limited to the one percent of the first resonant frequency of it's scanning unit i.e., piezoelectric tube scanner (PTS). In order to speed up the functioning of the AFM for high speed imaging, a resonant controller with an integral action has been applied in the both x and y axis of the PTS for damping the resonant mode of the scanner and improve the tracking performance. The overall closed-loop system with this scheme has higher bandwidth with improved gain and phase margin than the existing PI controller. It can reduce the cross coupling of the scanner and allows faster scanning. To measure the performance improvement of the proposed scheme a comparison has been made between the proposed controller scanned image and the existing AFM PI controller scanned image.

Original language	English
Article number	6426563
Pages (from-to)	2471-2476
Number of pages	6
Journal	Proceedings of the IEEE Conference on Decision and Control
DOIs	https://doi.org/10.1109/CDC.2012.6426563
Publication status	Published - 2012
Externally published	Yes
Event	51st IEEE Conference on Decision and Control, CDC 2012 - Maui, HI, United States Duration: 10 Dec 2012 → 13 Dec 2012

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10.1109/CDC.2012.6426563

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title = "Resonant controller for fast atomic force microscopy",

abstract = "The imaging performance of the atomic force microscope (AFM) in higher scanning speed is limited to the one percent of the first resonant frequency of it's scanning unit i.e., piezoelectric tube scanner (PTS). In order to speed up the functioning of the AFM for high speed imaging, a resonant controller with an integral action has been applied in the both x and y axis of the PTS for damping the resonant mode of the scanner and improve the tracking performance. The overall closed-loop system with this scheme has higher bandwidth with improved gain and phase margin than the existing PI controller. It can reduce the cross coupling of the scanner and allows faster scanning. To measure the performance improvement of the proposed scheme a comparison has been made between the proposed controller scanned image and the existing AFM PI controller scanned image.",

author = "Das, {Sajal K.} and Pota, {Hemanshu R.} and Petersen, {Ian R.}",

year = "2012",

doi = "10.1109/CDC.2012.6426563",

language = "English",

pages = "2471--2476",

journal = "Proceedings of the IEEE Conference on Decision and Control",

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publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "51st IEEE Conference on Decision and Control, CDC 2012 ; Conference date: 10-12-2012 Through 13-12-2012",

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T1 - Resonant controller for fast atomic force microscopy

AU - Das, Sajal K.

AU - Pota, Hemanshu R.

AU - Petersen, Ian R.

PY - 2012

Y1 - 2012

N2 - The imaging performance of the atomic force microscope (AFM) in higher scanning speed is limited to the one percent of the first resonant frequency of it's scanning unit i.e., piezoelectric tube scanner (PTS). In order to speed up the functioning of the AFM for high speed imaging, a resonant controller with an integral action has been applied in the both x and y axis of the PTS for damping the resonant mode of the scanner and improve the tracking performance. The overall closed-loop system with this scheme has higher bandwidth with improved gain and phase margin than the existing PI controller. It can reduce the cross coupling of the scanner and allows faster scanning. To measure the performance improvement of the proposed scheme a comparison has been made between the proposed controller scanned image and the existing AFM PI controller scanned image.

AB - The imaging performance of the atomic force microscope (AFM) in higher scanning speed is limited to the one percent of the first resonant frequency of it's scanning unit i.e., piezoelectric tube scanner (PTS). In order to speed up the functioning of the AFM for high speed imaging, a resonant controller with an integral action has been applied in the both x and y axis of the PTS for damping the resonant mode of the scanner and improve the tracking performance. The overall closed-loop system with this scheme has higher bandwidth with improved gain and phase margin than the existing PI controller. It can reduce the cross coupling of the scanner and allows faster scanning. To measure the performance improvement of the proposed scheme a comparison has been made between the proposed controller scanned image and the existing AFM PI controller scanned image.

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DO - 10.1109/CDC.2012.6426563

M3 - Conference article

AN - SCOPUS:84874284078

SN - 0743-1546

SP - 2471

EP - 2476

JO - Proceedings of the IEEE Conference on Decision and Control

JF - Proceedings of the IEEE Conference on Decision and Control

M1 - 6426563

T2 - 51st IEEE Conference on Decision and Control, CDC 2012

Y2 - 10 December 2012 through 13 December 2012

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Resonant controller for fast atomic force microscopy

Abstract

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