TY - CHAP
T1 - Robust approach to dynamic statistical process control
AU - McFarlane, Duncan C.
AU - Petersen, Ian R.
PY - 1996
Y1 - 1996
N2 - Statistical Process Control (SPC) technique are well established across a wide range of industries. In particular, the plotting of key steady state variables with their statistical limit against time (Shewart charting) is a common approach for monitoring the normality of production. This paper aims with extending Shewart charting techniques to the quality monitoring of variables driven by uncertain dynamic processes, which has particular application in the process industries where it is desirable to monitor process variables on-line as well as final product. The robust approach to dynamic SPC is based on previous work on guaranteed cost filtering for linear systems and is intended to provide a basis for both a wide application of SPC monitoring and also motivate unstructured fault detection.
AB - Statistical Process Control (SPC) technique are well established across a wide range of industries. In particular, the plotting of key steady state variables with their statistical limit against time (Shewart charting) is a common approach for monitoring the normality of production. This paper aims with extending Shewart charting techniques to the quality monitoring of variables driven by uncertain dynamic processes, which has particular application in the process industries where it is desirable to monitor process variables on-line as well as final product. The robust approach to dynamic SPC is based on previous work on guaranteed cost filtering for linear systems and is intended to provide a basis for both a wide application of SPC monitoring and also motivate unstructured fault detection.
UR - https://www.scopus.com/pages/publications/0030378401
M3 - Chapter
AN - SCOPUS:0030378401
T3 - Proceedings of the IEEE Conference on Decision and Control
SP - 2355
EP - 3592
BT - Proceedings of the IEEE Conference on Decision and Control
A2 - Anon, null
T2 - Proceedings of the 1996 35th IEEE Conference on Decision and Control. Part 3 (of 4)
Y2 - 11 December 1996 through 13 December 1996
ER -