Robust H control in fast atomic force microscopy

Ning Chuang*, Ian R. Petersen, Himanshu R. Pota

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

37 Citations (Scopus)

Abstract

This paper presents the design of a robust H controller for fast tracking of an Atomic Force Microscope (AFM). The controller design is based on a physical model of the AFM piezoelectric tube positioner. External capacitors are connected in series with the x and y contacts of the piezoelectric tube to provide measured voltages which are proportional to the charge on the actuator. The parameters for a nonlinear hysteresis model are obtained from measurements of the system frequency response and time domain response. Experimental results show that the robust H controller can increase the scanning speed significantly.

Original languageEnglish
Title of host publicationProceedings of the 2011 American Control Conference, ACC 2011
Pages2258-2265
Number of pages8
Publication statusPublished - 2011
Externally publishedYes
Event2011 American Control Conference, ACC 2011 - San Francisco, CA, United States
Duration: 29 Jun 20111 Jul 2011

Publication series

NameProceedings of the American Control Conference
ISSN (Print)0743-1619

Conference

Conference2011 American Control Conference, ACC 2011
Country/TerritoryUnited States
CitySan Francisco, CA
Period29/06/111/07/11

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