Roughness of microspheres for force measurements

P. J. Van Zwol; G. Palasantzas; M. Van De Schootbrugge; J. Th M. De Hosson; V. S.J. Craig

doi:10.1021/la800664f

Roughness of microspheres for force measurements

P. J. Van Zwol, G. Palasantzas^*, M. Van De Schootbrugge, J. Th M. De Hosson, V. S.J. Craig

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

33 Citations (Scopus)

Abstract

We have investigated the morphology and surface roughness of several commercially available microspheres to determine their suitability for force measurements using the atomic force microscope. The roughness varies considerably, depending on sphere size and material, ranging from nearly ideally flat up to micrometer-sized features. Because surface roughness significantly influences the magnitude and accuracy of measurement of surface forces, the results presented here should be helpful for colloid physicists and in particular for those performing force measurements.

Original language	English
Pages (from-to)	7528-7531
Number of pages	4
Journal	Langmuir
Volume	24
Issue number	14
DOIs	https://doi.org/10.1021/la800664f
Publication status	Published - 15 Jul 2008

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abstract = "We have investigated the morphology and surface roughness of several commercially available microspheres to determine their suitability for force measurements using the atomic force microscope. The roughness varies considerably, depending on sphere size and material, ranging from nearly ideally flat up to micrometer-sized features. Because surface roughness significantly influences the magnitude and accuracy of measurement of surface forces, the results presented here should be helpful for colloid physicists and in particular for those performing force measurements.",

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AU - Palasantzas, G.

AU - Van De Schootbrugge, M.

AU - De Hosson, J. Th M.

AU - Craig, V. S.J.

PY - 2008/7/15

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N2 - We have investigated the morphology and surface roughness of several commercially available microspheres to determine their suitability for force measurements using the atomic force microscope. The roughness varies considerably, depending on sphere size and material, ranging from nearly ideally flat up to micrometer-sized features. Because surface roughness significantly influences the magnitude and accuracy of measurement of surface forces, the results presented here should be helpful for colloid physicists and in particular for those performing force measurements.

AB - We have investigated the morphology and surface roughness of several commercially available microspheres to determine their suitability for force measurements using the atomic force microscope. The roughness varies considerably, depending on sphere size and material, ranging from nearly ideally flat up to micrometer-sized features. Because surface roughness significantly influences the magnitude and accuracy of measurement of surface forces, the results presented here should be helpful for colloid physicists and in particular for those performing force measurements.

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JO - Langmuir

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Roughness of microspheres for force measurements

Abstract

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