SAXS analysis of embedded Pt nanocrystals irradiated with swift heavy ions

R. Giulian*, P. Kluth, D. J. Sprouster, L. L. Araujo, A. P. Byrne, D. J. Cookson, M. C. Ridgway

*Corresponding author for this work

    Research output: Contribution to journalConference articlepeer-review


    Elongated Pt nanocrystals (NCs) formed in SiO2 by ion implantation, thermal annealing and swift heavy ion irradiation were analyzed by small-angle X-ray scattering (SAXS) and transmission electron microscopy (TEM) measurements. Transmission SAXS measurements were performed in samples aligned at different angles relative to the photon beam resulting in non-isotropic scattering and thus enabling the three dimensional analysis of the NCs. Selected angular sectors of the detector were integrated and analyzed separately, leading to the individual evaluation of both the major and minor dimensions of the rod-shaped NCs. This method enables the use of well established spherical models for the SAXS data analysis and yielded excellent agreement with TEM results.

    Original languageEnglish
    Pages (from-to)45-47
    Number of pages3
    JournalAIP Conference Proceedings
    Publication statusPublished - 2009
    Event6th International Conference on Synchrotron Radiation in Materials Science - Campinas, Sao Paulo, Brazil
    Duration: 20 Jul 200823 Jul 2008


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