SAXS analysis of embedded Pt nanocrystals irradiated with swift heavy ions

R. Giulian; P. Kluth; D. J. Sprouster; L. L. Araujo; A. P. Byrne; D. J. Cookson; M. C. Ridgway

doi:10.1063/1.3086232

SAXS analysis of embedded Pt nanocrystals irradiated with swift heavy ions

R. Giulian^*, P. Kluth, D. J. Sprouster, L. L. Araujo, A. P. Byrne, D. J. Cookson, M. C. Ridgway

^*Corresponding author for this work

Research output: Contribution to journal › Conference article › peer-review

Abstract

Elongated Pt nanocrystals (NCs) formed in SiO₂ by ion implantation, thermal annealing and swift heavy ion irradiation were analyzed by small-angle X-ray scattering (SAXS) and transmission electron microscopy (TEM) measurements. Transmission SAXS measurements were performed in samples aligned at different angles relative to the photon beam resulting in non-isotropic scattering and thus enabling the three dimensional analysis of the NCs. Selected angular sectors of the detector were integrated and analyzed separately, leading to the individual evaluation of both the major and minor dimensions of the rod-shaped NCs. This method enables the use of well established spherical models for the SAXS data analysis and yielded excellent agreement with TEM results.

Original language	English
Pages (from-to)	45-47
Number of pages	3
Journal	AIP Conference Proceedings
Volume	1092
DOIs	https://doi.org/10.1063/1.3086232
Publication status	Published - 2009
Event	6th International Conference on Synchrotron Radiation in Materials Science - Campinas, Sao Paulo, Brazil Duration: 20 Jul 2008 → 23 Jul 2008

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@article{d679256605e341839a28412a3595ed30,

title = "SAXS analysis of embedded Pt nanocrystals irradiated with swift heavy ions",

abstract = "Elongated Pt nanocrystals (NCs) formed in SiO2 by ion implantation, thermal annealing and swift heavy ion irradiation were analyzed by small-angle X-ray scattering (SAXS) and transmission electron microscopy (TEM) measurements. Transmission SAXS measurements were performed in samples aligned at different angles relative to the photon beam resulting in non-isotropic scattering and thus enabling the three dimensional analysis of the NCs. Selected angular sectors of the detector were integrated and analyzed separately, leading to the individual evaluation of both the major and minor dimensions of the rod-shaped NCs. This method enables the use of well established spherical models for the SAXS data analysis and yielded excellent agreement with TEM results.",

keywords = "Angle-dependent SAXS measurements, Elongated NCs, Swift heavy ion irradiation",

author = "R. Giulian and P. Kluth and Sprouster, {D. J.} and Araujo, {L. L.} and Byrne, {A. P.} and Cookson, {D. J.} and Ridgway, {M. C.}",

year = "2009",

doi = "10.1063/1.3086232",

language = "English",

volume = "1092",

pages = "45--47",

journal = "AIP Conference Proceedings",

issn = "0094-243X",

publisher = "American Institute of Physics",

note = "6th International Conference on Synchrotron Radiation in Materials Science ; Conference date: 20-07-2008 Through 23-07-2008",

}

TY - JOUR

T1 - SAXS analysis of embedded Pt nanocrystals irradiated with swift heavy ions

AU - Giulian, R.

AU - Kluth, P.

AU - Sprouster, D. J.

AU - Araujo, L. L.

AU - Byrne, A. P.

AU - Cookson, D. J.

AU - Ridgway, M. C.

PY - 2009

Y1 - 2009

N2 - Elongated Pt nanocrystals (NCs) formed in SiO2 by ion implantation, thermal annealing and swift heavy ion irradiation were analyzed by small-angle X-ray scattering (SAXS) and transmission electron microscopy (TEM) measurements. Transmission SAXS measurements were performed in samples aligned at different angles relative to the photon beam resulting in non-isotropic scattering and thus enabling the three dimensional analysis of the NCs. Selected angular sectors of the detector were integrated and analyzed separately, leading to the individual evaluation of both the major and minor dimensions of the rod-shaped NCs. This method enables the use of well established spherical models for the SAXS data analysis and yielded excellent agreement with TEM results.

AB - Elongated Pt nanocrystals (NCs) formed in SiO2 by ion implantation, thermal annealing and swift heavy ion irradiation were analyzed by small-angle X-ray scattering (SAXS) and transmission electron microscopy (TEM) measurements. Transmission SAXS measurements were performed in samples aligned at different angles relative to the photon beam resulting in non-isotropic scattering and thus enabling the three dimensional analysis of the NCs. Selected angular sectors of the detector were integrated and analyzed separately, leading to the individual evaluation of both the major and minor dimensions of the rod-shaped NCs. This method enables the use of well established spherical models for the SAXS data analysis and yielded excellent agreement with TEM results.

KW - Angle-dependent SAXS measurements

KW - Elongated NCs

KW - Swift heavy ion irradiation

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U2 - 10.1063/1.3086232

DO - 10.1063/1.3086232

M3 - Conference article

SN - 0094-243X

VL - 1092

SP - 45

EP - 47

JO - AIP Conference Proceedings

JF - AIP Conference Proceedings

T2 - 6th International Conference on Synchrotron Radiation in Materials Science

Y2 - 20 July 2008 through 23 July 2008

ER -

SAXS analysis of embedded Pt nanocrystals irradiated with swift heavy ions

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