SAXS investigation of un-etched and etched ion tracks in polycarbonate

U. H. Hossain; M. D. Rodriguez; D. Schauries; A. Hadley; M. Schleberger; C. Trautmann; S. Mudie; P. Kluth

doi:10.1016/j.nimb.2017.04.023

SAXS investigation of un-etched and etched ion tracks in polycarbonate

U. H. Hossain^*, M. D. Rodriguez, D. Schauries, A. Hadley, M. Schleberger, C. Trautmann, S. Mudie, P. Kluth

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

16 Citations (Scopus)

Abstract

Investigation of the ion track morphologies and track etching behaviour in polycarbonate (PC) films was carried out using synchrotron based small-angle X-ray scattering (SAXS) measurements. The tracks were induced by Au ions with kinetic energies of 1.7 and 2.2 GeV with applied fluences between 1 × 10¹⁰ and 1 × 10¹² ions/cm². The average radii of the un-etched tracks were studied as a function of the irradiation fluence, indicating a general ion induced degradation of the polymer, with a simultaneous increase in ion track radius from 2.6 ± 0.002 nm to 3.4 ± 0.03 nm. Chemical etching of the ion tracks in PC leads to the formation of cylindrical pores. The pore radius increases linearly with etching time. In 3 M NaOH at 55 °C, a radial etching rate of 9.2 nm/min is observed.

Original language	English
Pages (from-to)	293-297
Number of pages	5
Journal	Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume	409
DOIs	https://doi.org/10.1016/j.nimb.2017.04.023
Publication status	Published - 15 Oct 2017

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@article{a3ff928202324e64ad64cb6f5673d053,

title = "SAXS investigation of un-etched and etched ion tracks in polycarbonate",

abstract = "Investigation of the ion track morphologies and track etching behaviour in polycarbonate (PC) films was carried out using synchrotron based small-angle X-ray scattering (SAXS) measurements. The tracks were induced by Au ions with kinetic energies of 1.7 and 2.2 GeV with applied fluences between 1 × 1010 and 1 × 1012 ions/cm2. The average radii of the un-etched tracks were studied as a function of the irradiation fluence, indicating a general ion induced degradation of the polymer, with a simultaneous increase in ion track radius from 2.6 ± 0.002 nm to 3.4 ± 0.03 nm. Chemical etching of the ion tracks in PC leads to the formation of cylindrical pores. The pore radius increases linearly with etching time. In 3 M NaOH at 55 °C, a radial etching rate of 9.2 nm/min is observed.",

keywords = "Polycarbonate (PC), Radiation degradation, Small-angle X-ray scattering (SAXS), Swift heavy ion tracks",

author = "Hossain, {U. H.} and Rodriguez, {M. D.} and D. Schauries and A. Hadley and M. Schleberger and C. Trautmann and S. Mudie and P. Kluth",

note = "Publisher Copyright: {\textcopyright} 2017 Elsevier B.V.",

year = "2017",

month = oct,

day = "15",

doi = "10.1016/j.nimb.2017.04.023",

language = "English",

volume = "409",

pages = "293--297",

journal = "Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms",

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TY - JOUR

T1 - SAXS investigation of un-etched and etched ion tracks in polycarbonate

AU - Hossain, U. H.

AU - Rodriguez, M. D.

AU - Schauries, D.

AU - Hadley, A.

AU - Schleberger, M.

AU - Trautmann, C.

AU - Mudie, S.

AU - Kluth, P.

PY - 2017/10/15

Y1 - 2017/10/15

N2 - Investigation of the ion track morphologies and track etching behaviour in polycarbonate (PC) films was carried out using synchrotron based small-angle X-ray scattering (SAXS) measurements. The tracks were induced by Au ions with kinetic energies of 1.7 and 2.2 GeV with applied fluences between 1 × 1010 and 1 × 1012 ions/cm2. The average radii of the un-etched tracks were studied as a function of the irradiation fluence, indicating a general ion induced degradation of the polymer, with a simultaneous increase in ion track radius from 2.6 ± 0.002 nm to 3.4 ± 0.03 nm. Chemical etching of the ion tracks in PC leads to the formation of cylindrical pores. The pore radius increases linearly with etching time. In 3 M NaOH at 55 °C, a radial etching rate of 9.2 nm/min is observed.

AB - Investigation of the ion track morphologies and track etching behaviour in polycarbonate (PC) films was carried out using synchrotron based small-angle X-ray scattering (SAXS) measurements. The tracks were induced by Au ions with kinetic energies of 1.7 and 2.2 GeV with applied fluences between 1 × 1010 and 1 × 1012 ions/cm2. The average radii of the un-etched tracks were studied as a function of the irradiation fluence, indicating a general ion induced degradation of the polymer, with a simultaneous increase in ion track radius from 2.6 ± 0.002 nm to 3.4 ± 0.03 nm. Chemical etching of the ion tracks in PC leads to the formation of cylindrical pores. The pore radius increases linearly with etching time. In 3 M NaOH at 55 °C, a radial etching rate of 9.2 nm/min is observed.

KW - Polycarbonate (PC)

KW - Radiation degradation

KW - Small-angle X-ray scattering (SAXS)

KW - Swift heavy ion tracks

UR - http://www.scopus.com/inward/record.url?scp=85017428087&partnerID=8YFLogxK

U2 - 10.1016/j.nimb.2017.04.023

DO - 10.1016/j.nimb.2017.04.023

M3 - Article

SN - 0168-583X

VL - 409

SP - 293

EP - 297

JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

ER -

SAXS investigation of un-etched and etched ion tracks in polycarbonate

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