Series resistance as a function of current and its application in solar cell analysis 37 th IEEE photovoltaic specialists conference

Kean Chern Fong*, Keith R. McIntosh, Andrew W. Blakers, Evan T. Franklin

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    3 Citations (Scopus)

    Abstract

    The series resistance of a solar cell varies with its operating conditions. However, most solar cell characterization is done by assuming the series resistance is represented as a constant value. This paper presents the application of the multi light method to extract R s-light and R s-dark as a function of current. Application of R s(J) to analysis of solar cell is demonstrated by extracting the R s-corrected J-V curve. This allows evaluation of the p-n junction without the parasitic R s effects. Since the R s(J) and R s-corrected J-V data is measured in high detail, the total losses from the R s and the pseudo efficiency can be measured without need of curve fitting. Finally, by including R s(J) to the modelling of solar cells, errors in parameterization caused by variation in R s value is eliminated.

    Original languageEnglish
    Title of host publicationProgram - 37th IEEE Photovoltaic Specialists Conference, PVSC 2011
    Pages2257-2261
    Number of pages5
    DOIs
    Publication statusPublished - 2011
    Event37th IEEE Photovoltaic Specialists Conference, PVSC 2011 - Seattle, WA, United States
    Duration: 19 Jun 201124 Jun 2011

    Publication series

    NameConference Record of the IEEE Photovoltaic Specialists Conference
    ISSN (Print)0160-8371

    Conference

    Conference37th IEEE Photovoltaic Specialists Conference, PVSC 2011
    Country/TerritoryUnited States
    CitySeattle, WA
    Period19/06/1124/06/11

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