Series resistance as a function of current and its application in solar cell analysis 37 th IEEE photovoltaic specialists conference

Kean Chern Fong; Keith R. McIntosh; Andrew W. Blakers; Evan T. Franklin

doi:10.1109/PVSC.2011.6186405

Series resistance as a function of current and its application in solar cell analysis 37 ^th IEEE photovoltaic specialists conference

Kean Chern Fong^*, Keith R. McIntosh, Andrew W. Blakers, Evan T. Franklin

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › peer-review

3 Citations (Scopus)

Abstract

The series resistance of a solar cell varies with its operating conditions. However, most solar cell characterization is done by assuming the series resistance is represented as a constant value. This paper presents the application of the multi light method to extract R _s-light and R _s-dark as a function of current. Application of R _s(J) to analysis of solar cell is demonstrated by extracting the R _s-corrected J-V curve. This allows evaluation of the p-n junction without the parasitic R _s effects. Since the R _s(J) and R _s-corrected J-V data is measured in high detail, the total losses from the R _s and the pseudo efficiency can be measured without need of curve fitting. Finally, by including R _s(J) to the modelling of solar cells, errors in parameterization caused by variation in R _s value is eliminated.

Original language	English
Title of host publication	Program - 37th IEEE Photovoltaic Specialists Conference, PVSC 2011
Pages	2257-2261
Number of pages	5
DOIs	https://doi.org/10.1109/PVSC.2011.6186405
Publication status	Published - 2011
Event	37th IEEE Photovoltaic Specialists Conference, PVSC 2011 - Seattle, WA, United States Duration: 19 Jun 2011 → 24 Jun 2011

Publication series

Name	Conference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)	0160-8371

Conference

Conference	37th IEEE Photovoltaic Specialists Conference, PVSC 2011
Country/Territory	United States
City	Seattle, WA
Period	19/06/11 → 24/06/11

Access to Document

10.1109/PVSC.2011.6186405

Cite this

Fong, K. C., McIntosh, K. R., Blakers, A. W., & Franklin, E. T. (2011). Series resistance as a function of current and its application in solar cell analysis 37 ^th IEEE photovoltaic specialists conference. In Program - 37th IEEE Photovoltaic Specialists Conference, PVSC 2011 (pp. 2257-2261). Article 6186405 (Conference Record of the IEEE Photovoltaic Specialists Conference). https://doi.org/10.1109/PVSC.2011.6186405

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title = "Series resistance as a function of current and its application in solar cell analysis 37 th IEEE photovoltaic specialists conference",

abstract = "The series resistance of a solar cell varies with its operating conditions. However, most solar cell characterization is done by assuming the series resistance is represented as a constant value. This paper presents the application of the multi light method to extract R s-light and R s-dark as a function of current. Application of R s(J) to analysis of solar cell is demonstrated by extracting the R s-corrected J-V curve. This allows evaluation of the p-n junction without the parasitic R s effects. Since the R s(J) and R s-corrected J-V data is measured in high detail, the total losses from the R s and the pseudo efficiency can be measured without need of curve fitting. Finally, by including R s(J) to the modelling of solar cells, errors in parameterization caused by variation in R s value is eliminated.",

author = "Fong, \{Kean Chern\} and McIntosh, \{Keith R.\} and Blakers, \{Andrew W.\} and Franklin, \{Evan T.\}",

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pages = "2257--2261",

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note = "37th IEEE Photovoltaic Specialists Conference, PVSC 2011 ; Conference date: 19-06-2011 Through 24-06-2011",

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Fong, KC, McIntosh, KR, Blakers, AW & Franklin, ET 2011, Series resistance as a function of current and its application in solar cell analysis 37 ^th IEEE photovoltaic specialists conference. in Program - 37th IEEE Photovoltaic Specialists Conference, PVSC 2011., 6186405, Conference Record of the IEEE Photovoltaic Specialists Conference, pp. 2257-2261, 37th IEEE Photovoltaic Specialists Conference, PVSC 2011, Seattle, WA, United States, 19/06/11. https://doi.org/10.1109/PVSC.2011.6186405

Series resistance as a function of current and its application in solar cell analysis 37 ^th IEEE photovoltaic specialists conference. / Fong, Kean Chern; McIntosh, Keith R.; Blakers, Andrew W. et al.
Program - 37th IEEE Photovoltaic Specialists Conference, PVSC 2011. 2011. p. 2257-2261 6186405 (Conference Record of the IEEE Photovoltaic Specialists Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › peer-review

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N2 - The series resistance of a solar cell varies with its operating conditions. However, most solar cell characterization is done by assuming the series resistance is represented as a constant value. This paper presents the application of the multi light method to extract R s-light and R s-dark as a function of current. Application of R s(J) to analysis of solar cell is demonstrated by extracting the R s-corrected J-V curve. This allows evaluation of the p-n junction without the parasitic R s effects. Since the R s(J) and R s-corrected J-V data is measured in high detail, the total losses from the R s and the pseudo efficiency can be measured without need of curve fitting. Finally, by including R s(J) to the modelling of solar cells, errors in parameterization caused by variation in R s value is eliminated.

AB - The series resistance of a solar cell varies with its operating conditions. However, most solar cell characterization is done by assuming the series resistance is represented as a constant value. This paper presents the application of the multi light method to extract R s-light and R s-dark as a function of current. Application of R s(J) to analysis of solar cell is demonstrated by extracting the R s-corrected J-V curve. This allows evaluation of the p-n junction without the parasitic R s effects. Since the R s(J) and R s-corrected J-V data is measured in high detail, the total losses from the R s and the pseudo efficiency can be measured without need of curve fitting. Finally, by including R s(J) to the modelling of solar cells, errors in parameterization caused by variation in R s value is eliminated.

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Fong KC, McIntosh KR, Blakers AW, Franklin ET. Series resistance as a function of current and its application in solar cell analysis 37 ^th IEEE photovoltaic specialists conference. In Program - 37th IEEE Photovoltaic Specialists Conference, PVSC 2011. 2011. p. 2257-2261. 6186405. (Conference Record of the IEEE Photovoltaic Specialists Conference). doi: 10.1109/PVSC.2011.6186405