Shearlet transform based anomaly detection for hyperspectral image

Hui Xin Zhou*, Xiao Xue Niu, Han Lin Qin, Jun Zhou, Rui Lai, Bing Jian Wang

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    2 Citations (Scopus)

    Abstract

    Hyperspectral image (HI) contains data in hundreds of narrow contiguous spectral bands, thus it provides a powerful means to distinguish different materials on the basis of their unique spectral signatures. Anomaly detection (AD) is one key part of its application. The shearlet transform (ST) is a new two-dimensional extension of the wavelet transform using multiscale and directional filter banks, which can effectively captures smooth contours that are the dominant feature in natural image. In this paper, ST is used in AD for the HI. Firstly, the raw HI data is decomposed into several directional subband at multiple-scale via ST. Thus, the background signal would be reduced in each subband. Secondly, the fourth partial differential equation method is adopted to modify the coefficient of each sub-band, which is for background suppression and anomaly signal enhancement. Thirdly, the kernel-based RX algorithm is adopted to detect the anomaly in each sub-band. Finally, the anomaly signal image is achieved by reconstructing the image with all modified sub-band. Several experiments with a HYDICE data are fulfilled to validate the performance of the proposed method. Compared with the original RX algorithm, experimental results show that the proposed algorithm has better detection performance and lower false alarm probability.

    Original languageEnglish
    Title of host publication6th International Symposium on Advanced Optical Manufacturing and Testing Technologies
    Subtitle of host publicationOptoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy
    DOIs
    Publication statusPublished - 2012
    Event6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy - Xiamen, China
    Duration: 26 Apr 201229 Apr 2012

    Publication series

    NameProceedings of SPIE - The International Society for Optical Engineering
    Volume8419
    ISSN (Print)0277-786X

    Conference

    Conference6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy
    Country/TerritoryChina
    CityXiamen
    Period26/04/1229/04/12

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