Simple concepts for ion source improvement

P. A. Hausladen, D. C. Weisser*, N. R. Lobanov, L. K. Fifield, H. J. Wallace

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    16 Citations (Scopus)

    Abstract

    We report on improvements in the overall intensity of a sputter ion source that evolved originally from an NEC MCSNICS. Beam output increases benefit both AMS measurements and nuclear physics experiments using low natural abundance beams. In particular, minor changes in source geometry suggested by a combination of electrostatic calculations and simple design principles have yielded increases in extracted negative ion intensity of nearly a factor of 4.

    Original languageEnglish
    Pages (from-to)402-404
    Number of pages3
    JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
    Volume190
    Issue number1-4
    DOIs
    Publication statusPublished - May 2002

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