Simplified Stability Tests for Delay-Differential Systems

Nozomu Hamada; Brian D.O. Anderson

doi:10.1109/TCS.1983.1085376

Simplified Stability Tests for Delay-Differential Systems

Nozomu Hamada, Brian D.O. Anderson^*

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

The task of checking that the zeros of a prescribed real exponential polynomial all have negative real part arises in examining the stability of delay-differential systems. We describe new tests which are akin to the reduced order Hermite, reduced Markov, and Liénard–Chipart stability tests for ordinary real polynomials.

Original language	English
Pages (from-to)	488-492
Number of pages	5
Journal	IEEE Transactions on Circuits and Systems
Volume	30
Issue number	7
DOIs	https://doi.org/10.1109/TCS.1983.1085376
Publication status	Published - Jul 1983
Externally published	Yes

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10.1109/TCS.1983.1085376

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title = "Simplified Stability Tests for Delay-Differential Systems",

abstract = "The task of checking that the zeros of a prescribed real exponential polynomial all have negative real part arises in examining the stability of delay-differential systems. We describe new tests which are akin to the reduced order Hermite, reduced Markov, and Li{\'e}nard–Chipart stability tests for ordinary real polynomials.",

author = "Nozomu Hamada and Anderson, \{Brian D.O.\}",

year = "1983",

month = jul,

doi = "10.1109/TCS.1983.1085376",

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pages = "488--492",

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AU - Anderson, Brian D.O.

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AB - The task of checking that the zeros of a prescribed real exponential polynomial all have negative real part arises in examining the stability of delay-differential systems. We describe new tests which are akin to the reduced order Hermite, reduced Markov, and Liénard–Chipart stability tests for ordinary real polynomials.

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DO - 10.1109/TCS.1983.1085376

M3 - Article

AN - SCOPUS:0020790136

SN - 0098-4094

VL - 30

SP - 488

EP - 492

JO - IEEE Transactions on Circuits and Systems

JF - IEEE Transactions on Circuits and Systems

IS - 7

ER -

Simplified Stability Tests for Delay-Differential Systems

Abstract

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