TY - JOUR
T1 - Single electron tracks in water vapour for energies below 100 eV
AU - Muñoz, A.
AU - Blanco, F.
AU - Garcia, G.
AU - Thorn, P. A.
AU - Brunger, M. J.
AU - Sullivan, J. P.
AU - Buckman, S. J.
PY - 2008/11/1
Y1 - 2008/11/1
N2 - A new method to simulate single electron tracks, from 0 to 100 eV, in water vapour is described. In this method we employ as input parameters the experimental and theoretical electron interaction cross sections and also relevant experimental energy loss distribution functions. Most of the open inelastic processes (ionization, neutral dissociation, electronic, vibrational and rotational excitation) are considered in this energy range, as well as the elastic scattering channel. Angular distributions of the scattered electrons have been related to the momentum transfer, indicating some analytical regularity which allows us to greatly simplify the computational procedures. The determined simulated track structure has then been used to derive energy deposition profiles, and thus the induced radiation damage.
AB - A new method to simulate single electron tracks, from 0 to 100 eV, in water vapour is described. In this method we employ as input parameters the experimental and theoretical electron interaction cross sections and also relevant experimental energy loss distribution functions. Most of the open inelastic processes (ionization, neutral dissociation, electronic, vibrational and rotational excitation) are considered in this energy range, as well as the elastic scattering channel. Angular distributions of the scattered electrons have been related to the momentum transfer, indicating some analytical regularity which allows us to greatly simplify the computational procedures. The determined simulated track structure has then been used to derive energy deposition profiles, and thus the induced radiation damage.
KW - Electron cross sections in water
KW - Electron track simulation
UR - http://www.scopus.com/inward/record.url?scp=53449090852&partnerID=8YFLogxK
U2 - 10.1016/j.ijms.2008.04.028
DO - 10.1016/j.ijms.2008.04.028
M3 - Article
SN - 1387-3806
VL - 277
SP - 175
EP - 179
JO - International Journal of Mass Spectrometry
JF - International Journal of Mass Spectrometry
IS - 1-3
ER -