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Single Rare-Earth Ions as Atomic-Scale Probes in Ultrascaled Transistors

Qi Zhang, Guangchong Hu, Gabriele G. De Boo, Miloš Rančić, Brett C. Johnson, Jeffrey C. McCallum, Jiangfeng Du, Matthew J. Sellars, Chunming Yin*, Sven Rogge

*Corresponding author for this work

    Research output: Contribution to journal › Article › peer-review

    18 Citations (Scopus)

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