Size-dependent structural disorder in nanocrystalline Cu probed by synchrotron-based X-ray techniques

B. Johannessen; P. Kluth; D. J. Cookson; G. J. Foran; M. C. Ridgway

doi:10.1016/j.nimb.2005.12.015

Size-dependent structural disorder in nanocrystalline Cu probed by synchrotron-based X-ray techniques

B. Johannessen^*, P. Kluth, D. J. Cookson, G. J. Foran, M. C. Ridgway

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

8 Citations (Scopus)

Abstract

Elemental Cu nanocrystals were synthesized in thin film SiO₂ by ion implantation and thermal annealing. The local atomic structure and nanocrystal size distribution were investigated by means of extended X-ray absorption fine structure (EXAFS) spectroscopy and small angle X-ray scattering (SAXS), respectively. We quantify the bondlength contraction and increased structural disorder in the nanocrystals as compared to a bulk Cu reference. Both are proportional to the inverse of the nanocrystal diameter, which in turn is proportional to the surface-area-to-volume ratio. In particular we show that a simple liquid-drop model can explain the bondlength contraction and estimate the surface tension of nanocrystalline Cu to be 3.8 ± 0.4 J/m².

Original language	English
Pages (from-to)	45-49
Number of pages	5
Journal	Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume	246
Issue number	1
DOIs	https://doi.org/10.1016/j.nimb.2005.12.015
Publication status	Published - May 2006

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title = "Size-dependent structural disorder in nanocrystalline Cu probed by synchrotron-based X-ray techniques",

abstract = "Elemental Cu nanocrystals were synthesized in thin film SiO2 by ion implantation and thermal annealing. The local atomic structure and nanocrystal size distribution were investigated by means of extended X-ray absorption fine structure (EXAFS) spectroscopy and small angle X-ray scattering (SAXS), respectively. We quantify the bondlength contraction and increased structural disorder in the nanocrystals as compared to a bulk Cu reference. Both are proportional to the inverse of the nanocrystal diameter, which in turn is proportional to the surface-area-to-volume ratio. In particular we show that a simple liquid-drop model can explain the bondlength contraction and estimate the surface tension of nanocrystalline Cu to be 3.8 ± 0.4 J/m2.",

keywords = "EXAFS, Ion implantation, Nanocrystals, SAXS",

author = "B. Johannessen and P. Kluth and Cookson, {D. J.} and Foran, {G. J.} and Ridgway, {M. C.}",

year = "2006",

month = may,

doi = "10.1016/j.nimb.2005.12.015",

language = "English",

volume = "246",

pages = "45--49",

journal = "Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms",

issn = "0168-583X",

publisher = "Elsevier B.V.",

number = "1",

}

Size-dependent structural disorder in nanocrystalline Cu probed by synchrotron-based X-ray techniques. / Johannessen, B.; Kluth, P.; Cookson, D. J. et al.
In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 246, No. 1, 05.2006, p. 45-49.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Size-dependent structural disorder in nanocrystalline Cu probed by synchrotron-based X-ray techniques

AU - Johannessen, B.

AU - Kluth, P.

AU - Cookson, D. J.

AU - Foran, G. J.

AU - Ridgway, M. C.

PY - 2006/5

Y1 - 2006/5

N2 - Elemental Cu nanocrystals were synthesized in thin film SiO2 by ion implantation and thermal annealing. The local atomic structure and nanocrystal size distribution were investigated by means of extended X-ray absorption fine structure (EXAFS) spectroscopy and small angle X-ray scattering (SAXS), respectively. We quantify the bondlength contraction and increased structural disorder in the nanocrystals as compared to a bulk Cu reference. Both are proportional to the inverse of the nanocrystal diameter, which in turn is proportional to the surface-area-to-volume ratio. In particular we show that a simple liquid-drop model can explain the bondlength contraction and estimate the surface tension of nanocrystalline Cu to be 3.8 ± 0.4 J/m2.

AB - Elemental Cu nanocrystals were synthesized in thin film SiO2 by ion implantation and thermal annealing. The local atomic structure and nanocrystal size distribution were investigated by means of extended X-ray absorption fine structure (EXAFS) spectroscopy and small angle X-ray scattering (SAXS), respectively. We quantify the bondlength contraction and increased structural disorder in the nanocrystals as compared to a bulk Cu reference. Both are proportional to the inverse of the nanocrystal diameter, which in turn is proportional to the surface-area-to-volume ratio. In particular we show that a simple liquid-drop model can explain the bondlength contraction and estimate the surface tension of nanocrystalline Cu to be 3.8 ± 0.4 J/m2.

KW - EXAFS

KW - Ion implantation

KW - Nanocrystals

KW - SAXS

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U2 - 10.1016/j.nimb.2005.12.015

DO - 10.1016/j.nimb.2005.12.015

M3 - Article

SN - 0168-583X

VL - 246

SP - 45

EP - 49

JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

IS - 1

ER -

Size-dependent structural disorder in nanocrystalline Cu probed by synchrotron-based X-ray techniques

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