@inproceedings{620c859deaa44a61a1319ea6caa19712,
title = "Slow minority carrier trapping and de-trapping in Czochralski silicon: Influence of thermal donors and the doping density",
abstract = "The trapping characteristics of defects related to thermal donors have been studied with transient photoconductance measurements in Cz monocrystalline silicon wafers. The samples were annealed for various lengths of time to create a range of thermal donor concentrations. The de-trapping time constant was measured using photoconductance decay after the illumination is turned off. In order to obtain an estimate of the de-trapping time constants, the measurements were fitted with exponential terms. We find that the de-trapping time constant is inversely related to the concentration of thermal donors, while trapping is not observed in samples without thermal donors.",
keywords = "Cz silicon, Minority carrier trapping, silicon defects, thermal donors",
author = "Manjula Siriwardhana and D. Macdonald and Heinz, {F. D.} and Rougieux, {F. E.}",
note = "Publisher Copyright: {\textcopyright} 2018 IEEE.; 7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018 ; Conference date: 10-06-2018 Through 15-06-2018",
year = "2018",
month = nov,
day = "26",
doi = "10.1109/PVSC.2018.8547946",
language = "English",
series = "2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "3312--3314",
booktitle = "2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC",
address = "United States",
}