Original language | English |
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Pages (from-to) | 1315-1316 |
Number of pages | 2 |
Journal | Asian Journal of Control |
Volume | 20 |
Issue number | 4 |
DOIs | |
Publication status | Published - Jul 2018 |
Special issue on recent emerging technologies in atomic force microscopy
Ian R. Petersen, S. O. Reza Moheimani
Research output: Contribution to journal › Editorial › peer-review