Special issue on recent emerging technologies in atomic force microscopy

Ian R. Petersen, S. O. Reza Moheimani

    Research output: Contribution to journalEditorialpeer-review

    Original languageEnglish
    Pages (from-to)1315-1316
    Number of pages2
    JournalAsian Journal of Control
    Volume20
    Issue number4
    DOIs
    Publication statusPublished - Jul 2018

    Cite this