Stationary and dispersive features in resonant inelastic soft X-ray scattering at the Ge 3p resonances

C. J. Glover, T. Schmitt, M. Mattesini, M. Adell, L. Ilver, J. Kanski, L. Kjeldgaard, M. Agåker, N. Mårtensson, R. Ahuja, J. Nordgren, J. E. Rubensson*

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    2 Citations (Scopus)

    Abstract

    Resonant inelastic soft X-ray scattering at the 3p resonances in crystalline Ge is presented. Both stationary and dispersive features are observed in a wide energy range above as well as below the ionization limits. These observations are in agreement with theoretical predictions based on a two-step model where the initially excited electron has no influence on the emission step. Excess population of states in the conduction band is found, and discussed in terms of attosecond electron dynamics.

    Original languageEnglish
    Pages (from-to)103-107
    Number of pages5
    JournalJournal of Electron Spectroscopy and Related Phenomena
    Volume173
    Issue number2-3
    DOIs
    Publication statusPublished - Jul 2009

    Fingerprint

    Dive into the research topics of 'Stationary and dispersive features in resonant inelastic soft X-ray scattering at the Ge 3p resonances'. Together they form a unique fingerprint.

    Cite this