TY - GEN
T1 - Stoichiometric low loss tellurium oxide thin films for photonic applications
AU - Vu, Khu T.
AU - Madden, Steve J.
AU - Luther-Davies, Barry
AU - Bulla, Douglas
PY - 2008
Y1 - 2008
N2 - Stoichiometric low loss Tellurium Oxide, TeO2, films have been produced by reactive RF sputtering. TeO2 films with propagation loss below 0.1dB/cm at 1550nm have been achieved in as deposited films.
AB - Stoichiometric low loss Tellurium Oxide, TeO2, films have been produced by reactive RF sputtering. TeO2 films with propagation loss below 0.1dB/cm at 1550nm have been achieved in as deposited films.
UR - http://www.scopus.com/inward/record.url?scp=54049157805&partnerID=8YFLogxK
U2 - 10.1109/OECCACOFT.2008.4610455
DO - 10.1109/OECCACOFT.2008.4610455
M3 - Conference contribution
SN - 0858258072
SN - 9780858258075
T3 - 2008 Joint Conference of the Opto-Electronics and Communications Conference and the Australian Conference On Optical Fibre Technology, OECC/ACOFT 2008
BT - 2008 Joint Conference of the Opto-Electronics and Communications Conference and the Australian Conference On Optical Fibre Technology, OECC/ACOFT 2008
T2 - 2008 Joint Conference of the Opto-Electronics and Communications Conference and the Australian Conference On Optical Fibre Technology, OECC/ACOFT 2008
Y2 - 7 July 2008 through 10 July 2008
ER -