Skip to main navigation Skip to search Skip to main content

Structural and optical characterization of vertical GaAs/GaP core-shell nanowires grown on Si substrates

  • Jung Hyun Kang*
  • , Qiang Gao
  • , Hannah J. Joyce
  • , Yong Kim
  • , Yanan Guo
  • , Hongyi Xu
  • , Jin Zou
  • , Melodie A. Fickenscher
  • , Leigh M. Smith
  • , Howard E. Jackson
  • , J. M. Yarrison-Rice
  • , Hark Hoe Tan
  • , Chennupati Jagadish
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference Paperpeer-review

Abstract

GaAs nanowires were grown on Si (111) substrates. By coating a thin GaAs buffer layer on Si surface and using a two-temperature growth, the morphology and crystal structure of GaAs nanowires were dramatically improved. The strained GaAs/GaP core-shell nanowires, based on the improved GaAs nanowires with a shell thickness of 25 nm, showed a significant shift in emission energy of 260 meV from the unstrained GaAs nanowires.

Original languageEnglish
Title of host publication2010 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2010 Proceedings
PublisherIEEE
Pages57-58
Number of pages2
ISBN (Print)9781424473328
DOIs
Publication statusPublished - 2010
Event2010 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2010 - Canberra, ACT, Australia
Duration: 12 Dec 201015 Dec 2010

Conference

Conference2010 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2010
Country/TerritoryAustralia
CityCanberra, ACT
Period12/12/1015/12/10

Fingerprint

Dive into the research topics of 'Structural and optical characterization of vertical GaAs/GaP core-shell nanowires grown on Si substrates'. Together they form a unique fingerprint.

Cite this