Abstract
Structural characterization of photomodified microvolumes formed by tightly focused femtosecond laser pulses inside silica glass was carried out using synchrotron x-ray diffraction. The observed distinct separation between the O-O and Si-Si pair correlation peaks can be interpreted as a phase separation induced by microexplosions at the focal volume. The mechanisms of structural transitions induced by femtosecond laser pulses inside dielectrics are discussed.
Original language | English |
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Article number | 124007 |
Journal | Journal of Optics |
Volume | 12 |
Issue number | 12 |
DOIs | |
Publication status | Published - Dec 2010 |