TY - JOUR
T1 - Structural Properties of Al-O Monolayers in SiO2 on Silicon and the Maximization of Their Negative Fixed Charge Density
AU - Hiller, Daniel
AU - Goettlicher, Joerg
AU - Steininger, Ralph
AU - Huthwelker, Thomas
AU - Julin, Jaakko
AU - Munnik, Frans
AU - Wahl, Michael
AU - Bock, Wolfgang
AU - Schoenaers, Ben
AU - Stesmans, Andre
AU - Koenig, Dirk
PY - 2018/9/12
Y1 - 2018/9/12
N2 - Al2O3 on Si is known to form an ultrathin interfacial SiO2 during deposition and subsequent annealing, which creates a negative fixed charge (Q(fix)) that enables field-effect passivation and low surface recombination velocities in Si solar cells. Various concepts were suggested to explain the origin of this negative Q(fix). In this study, we investigate Al-O monolayers (MLs) from atomic layer deposition (ALD) sandwiched between deliberately grown/deposited SiO2 films. We show that the Al atoms have an ultralow diffusion coefficient (similar to 4 x 10(-18) cm(2)/s at 1000 degrees C), are deposited at a constant rate of similar to 5 x 10(14) Al atoms/(cm(2) cycle) from the first ALD cycle, and are tetrahedral O-coordinated because the adjacent SiO2 imprints its tetrahedral near-order and bond length into the Al-O MLs. By variation in the tunnel-SiO2 thickness and the number of Al-O MLs, we demonstrate that the tetrahedral coordination alone is not sufficient for the formation of Q(fix) but that a SiO2/Al2O3 interface within a tunneling distance from the substrate must be present. The Al-induced acceptor states at these interfaces have energy levels slightly below the Si valence band edge and require charging by electrons from either the Si substrate or from Si/SiO2 dangling bonds to create a negative Q(fix). Hence, tunneling imposes limitations for the SiO2 and Al2O3 layer thicknesses. In addition, Coulomb repulsion between the charged acceptor states results in an optimum number of Al-O MLs, i.e., separation of both interfaces. We achieve maximum negative Q(fix) of similar to 5 X 10(12) cm(-2) (comparable to thick ALD-Al2O3 on Si) with similar to 1.7 nm tunnel-SiO2 and just seven ALD-Al2O3 cycles (similar to 8 angstrom) after optimized annealing at 850 degrees C for 30 s. The findings are discussed in the context of a passivating, hole-selective tunnel contact for high-efficiency Si solar cells.
AB - Al2O3 on Si is known to form an ultrathin interfacial SiO2 during deposition and subsequent annealing, which creates a negative fixed charge (Q(fix)) that enables field-effect passivation and low surface recombination velocities in Si solar cells. Various concepts were suggested to explain the origin of this negative Q(fix). In this study, we investigate Al-O monolayers (MLs) from atomic layer deposition (ALD) sandwiched between deliberately grown/deposited SiO2 films. We show that the Al atoms have an ultralow diffusion coefficient (similar to 4 x 10(-18) cm(2)/s at 1000 degrees C), are deposited at a constant rate of similar to 5 x 10(14) Al atoms/(cm(2) cycle) from the first ALD cycle, and are tetrahedral O-coordinated because the adjacent SiO2 imprints its tetrahedral near-order and bond length into the Al-O MLs. By variation in the tunnel-SiO2 thickness and the number of Al-O MLs, we demonstrate that the tetrahedral coordination alone is not sufficient for the formation of Q(fix) but that a SiO2/Al2O3 interface within a tunneling distance from the substrate must be present. The Al-induced acceptor states at these interfaces have energy levels slightly below the Si valence band edge and require charging by electrons from either the Si substrate or from Si/SiO2 dangling bonds to create a negative Q(fix). Hence, tunneling imposes limitations for the SiO2 and Al2O3 layer thicknesses. In addition, Coulomb repulsion between the charged acceptor states results in an optimum number of Al-O MLs, i.e., separation of both interfaces. We achieve maximum negative Q(fix) of similar to 5 X 10(12) cm(-2) (comparable to thick ALD-Al2O3 on Si) with similar to 1.7 nm tunnel-SiO2 and just seven ALD-Al2O3 cycles (similar to 8 angstrom) after optimized annealing at 850 degrees C for 30 s. The findings are discussed in the context of a passivating, hole-selective tunnel contact for high-efficiency Si solar cells.
KW - Aluminum oxide
KW - Atomic layer deposition
KW - Hole-selective contact
KW - Negative fixed charge
KW - Silicon oxide
KW - Silicon surface passivation
UR - https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=anu_research_portal_plus2&SrcAuth=WosAPI&KeyUT=WOS:000444793000054&DestLinkType=FullRecord&DestApp=WOS_CPL
U2 - 10.1021/acsami.8b06098
DO - 10.1021/acsami.8b06098
M3 - Article
C2 - 30110151
SN - 1944-8244
VL - 10
SP - 30495
EP - 30505
JO - ACS applied materials & interfaces
JF - ACS applied materials & interfaces
IS - 36
ER -