Structural properties of nano-porous GaSb prepared by swift heavy-ion irradiation

C. Notthoff; P. Mota-Santiago; A. Hadley; U. H. Hossain; S. Jordan; C. Glover; S. Mudie; P. Kluth

doi:10.1016/j.nimb.2017.10.015

Structural properties of nano-porous GaSb prepared by swift heavy-ion irradiation

C. Notthoff^*, P. Mota-Santiago, A. Hadley, U. H. Hossain, S. Jordan, C. Glover, S. Mudie, P. Kluth

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

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Abstract

We are investigating the structural and optical properties of nano-porous GaSb formed by swift heavy ion irradiation using a combination of high resolution structural characterization techniques including synchrotron based small- and wide-angle X-ray scattering (SAXS/WAXS) and extended X-ray absorption fine structure (EXAFS), as well as optical measurements like Raman and Fourier transform infrared spectroscopy. In contrast to nano-porous GaSb prepared by low energy ion irradiation, the swift heavy ion irradiated samples do not show any sign of homo-polar bonding typical for amorphous materials in EXAFS measurements despite the observed significant structural disorder. Furthermore, X-ray diffraction and Raman-spectroscopy reveal the presence of small (<10 nm) crystallites inside the pore walls.

Original language	English
Pages (from-to)	126-132
Number of pages	7
Journal	Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume	435
DOIs	https://doi.org/10.1016/j.nimb.2017.10.015
Publication status	Published - 15 Nov 2018

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title = "Structural properties of nano-porous GaSb prepared by swift heavy-ion irradiation",

abstract = "We are investigating the structural and optical properties of nano-porous GaSb formed by swift heavy ion irradiation using a combination of high resolution structural characterization techniques including synchrotron based small- and wide-angle X-ray scattering (SAXS/WAXS) and extended X-ray absorption fine structure (EXAFS), as well as optical measurements like Raman and Fourier transform infrared spectroscopy. In contrast to nano-porous GaSb prepared by low energy ion irradiation, the swift heavy ion irradiated samples do not show any sign of homo-polar bonding typical for amorphous materials in EXAFS measurements despite the observed significant structural disorder. Furthermore, X-ray diffraction and Raman-spectroscopy reveal the presence of small (<10 nm) crystallites inside the pore walls.",

keywords = "EXAFS, FTIR, GaSb, Nano-pores, Raman, SAXS, Semiconductor, Swift heavy ion, WAXS",

author = "C. Notthoff and P. Mota-Santiago and A. Hadley and Hossain, {U. H.} and S. Jordan and C. Glover and S. Mudie and P. Kluth",

note = "Publisher Copyright: {\textcopyright} 2017 Elsevier B.V.",

year = "2018",

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doi = "10.1016/j.nimb.2017.10.015",

language = "English",

volume = "435",

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TY - JOUR

T1 - Structural properties of nano-porous GaSb prepared by swift heavy-ion irradiation

AU - Notthoff, C.

AU - Mota-Santiago, P.

AU - Hadley, A.

AU - Hossain, U. H.

AU - Jordan, S.

AU - Glover, C.

AU - Mudie, S.

AU - Kluth, P.

PY - 2018/11/15

Y1 - 2018/11/15

N2 - We are investigating the structural and optical properties of nano-porous GaSb formed by swift heavy ion irradiation using a combination of high resolution structural characterization techniques including synchrotron based small- and wide-angle X-ray scattering (SAXS/WAXS) and extended X-ray absorption fine structure (EXAFS), as well as optical measurements like Raman and Fourier transform infrared spectroscopy. In contrast to nano-porous GaSb prepared by low energy ion irradiation, the swift heavy ion irradiated samples do not show any sign of homo-polar bonding typical for amorphous materials in EXAFS measurements despite the observed significant structural disorder. Furthermore, X-ray diffraction and Raman-spectroscopy reveal the presence of small (<10 nm) crystallites inside the pore walls.

AB - We are investigating the structural and optical properties of nano-porous GaSb formed by swift heavy ion irradiation using a combination of high resolution structural characterization techniques including synchrotron based small- and wide-angle X-ray scattering (SAXS/WAXS) and extended X-ray absorption fine structure (EXAFS), as well as optical measurements like Raman and Fourier transform infrared spectroscopy. In contrast to nano-porous GaSb prepared by low energy ion irradiation, the swift heavy ion irradiated samples do not show any sign of homo-polar bonding typical for amorphous materials in EXAFS measurements despite the observed significant structural disorder. Furthermore, X-ray diffraction and Raman-spectroscopy reveal the presence of small (<10 nm) crystallites inside the pore walls.

KW - EXAFS

KW - FTIR

KW - GaSb

KW - Nano-pores

KW - Raman

KW - SAXS

KW - Semiconductor

KW - Swift heavy ion

KW - WAXS

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U2 - 10.1016/j.nimb.2017.10.015

DO - 10.1016/j.nimb.2017.10.015

M3 - Article

SN - 0168-583X

VL - 435

SP - 126

EP - 132

JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

ER -

Structural properties of nano-porous GaSb prepared by swift heavy-ion irradiation

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