Structural Properties of Tin-precipitates in Sio 2 Matrix for Third Generation Photovoltaics: A Small Angle X-Ray Scattering Investigation (poster)

D Bellet; E.  Bellet-Almaric; T.  Hanley; S Huang; E.C. Cho; E Pink; G Scardera; G Conibeer; D König; M.A. Green

Structural Properties of Tin-precipitates in Sio 2 Matrix for Third Generation Photovoltaics: A Small Angle X-Ray Scattering Investigation (poster)

D Bellet, E. Bellet-Almaric^*, T. Hanley, S Huang, E.C. Cho, E Pink, G Scardera, G Conibeer, D König, M.A. Green

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

This paper reports on the investigation of Third Generation Photovoltaics multilayers by using small angle X-ray scattering (SAXS). This method is well suited to get information concerning the size, the shape and its distribution of nano-particles after crystallisation. Data show a strong effect of the sample annealing on the SAXS intensity in agreement with a change in the microstructure. A first and simple data analysis (Guinier plot) of the data enables to get an average particles size. The comparison with Glancing Incident X-ray Diffraction data leads to a rather good agreement. The obtained particle size is much higher than the tin-rich SiO2 layer, suggesting that the 6 nm SiO2 layer is not efficient enough to stop the crystallisation at the interfaces.

Original language	English
Title of host publication	Proceedings of the Twenty Second European Photovoltaic Solar Energy Conference (22E-PVSEC)
Subtitle of host publication	3-7 September 2007, Milan, Italy
Editors	G. Willecke, Heinz Ossenbrink, Peter Helm
Pages	477-480
Number of pages	4
ISBN (Electronic)	3-936338-22-1
Publication status	Published - 7 Sept 2007
Externally published	Yes
Event	22nd European Photovoltaic Solar Energy Conference 2007 (22E-PVSEC) - Milan, Italy Duration: 3 Sept 2007 → 7 Sept 2007 https://cordis.europa.eu/event/id/27506-european-photovoltaic-solar-energy-conference https://www.eupvsec.org/index.php/conference/authors-workstation?view=article&id=287&catid=31 (Evidence of Peer Review)

Conference

Conference	22nd European Photovoltaic Solar Energy Conference 2007 (22E-PVSEC)
Abbreviated title	22E-PVSEC
Country/Territory	Italy
City	Milan
Period	3/09/07 → 7/09/07
Other	The 22nd European Photovoltaic Solar Energy Conference and Exhibition will take place from 3 to 7 September in Milan, Italy. The conference will provide a platform for dialogue and information exchange on the latest developments in photovoltaic (PV) solar research and development.
Internet address	https://cordis.europa.eu/event/id/27506-european-photovoltaic-solar-energy-conference https://www.eupvsec.org/index.php/conference/authors-workstation?view=article&id=287&catid=31 (Evidence of Peer Review)

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https://www.researchgate.net/publication/319852158_STRUCTURAL_PROPERTIES_OF_TIN-PRECIPITATES_IN_SIO_2_MATRIX_FOR_THIRD_GENERATION_PHOTOVOLTAICS_A_SMALL_ANGLE_X-RAY_SCATTERING_INVESTIGATION

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Bellet, D., Bellet-Almaric, E., Hanley, T., Huang, S., Cho, E. C., Pink, E., Scardera, G., Conibeer, G., König, D., & Green, M. A. (2007). Structural Properties of Tin-precipitates in Sio 2 Matrix for Third Generation Photovoltaics: A Small Angle X-Ray Scattering Investigation (poster). In G. Willecke, H. Ossenbrink, & P. Helm (Eds.), Proceedings of the Twenty Second European Photovoltaic Solar Energy Conference (22E-PVSEC): 3-7 September 2007, Milan, Italy (pp. 477-480). Article 1CV.2.24 https://www.researchgate.net/publication/319852158_STRUCTURAL_PROPERTIES_OF_TIN-PRECIPITATES_IN_SIO_2_MATRIX_FOR_THIRD_GENERATION_PHOTOVOLTAICS_A_SMALL_ANGLE_X-RAY_SCATTERING_INVESTIGATION

Bellet, D ; Bellet-Almaric, E. ; Hanley, T. et al. / Structural Properties of Tin-precipitates in Sio 2 Matrix for Third Generation Photovoltaics: A Small Angle X-Ray Scattering Investigation (poster). Proceedings of the Twenty Second European Photovoltaic Solar Energy Conference (22E-PVSEC): 3-7 September 2007, Milan, Italy. editor / G. Willecke ; Heinz Ossenbrink ; Peter Helm. 2007. pp. 477-480

@inproceedings{30f6c2c57d4c42fd82687449cc9e20c0,

title = "Structural Properties of Tin-precipitates in Sio 2 Matrix for Third Generation Photovoltaics: A Small Angle X-Ray Scattering Investigation (poster)",

abstract = "This paper reports on the investigation of Third Generation Photovoltaics multilayers by using small angle X-ray scattering (SAXS). This method is well suited to get information concerning the size, the shape and its distribution of nano-particles after crystallisation. Data show a strong effect of the sample annealing on the SAXS intensity in agreement with a change in the microstructure. A first and simple data analysis (Guinier plot) of the data enables to get an average particles size. The comparison with Glancing Incident X-ray Diffraction data leads to a rather good agreement. The obtained particle size is much higher than the tin-rich SiO2 layer, suggesting that the 6 nm SiO2 layer is not efficient enough to stop the crystallisation at the interfaces.",

keywords = "Characterization, Nanoparticles, Small Angle X-ray Scattering (SAXS)",

author = "D Bellet and E. Bellet-Almaric and T. Hanley and S Huang and E.C. Cho and E Pink and G Scardera and G Conibeer and D K{\"o}nig and M.A. Green",

year = "2007",

month = sep,

day = "7",

language = "English",

pages = "477--480",

editor = "Willecke, {G. } and Heinz Ossenbrink and Peter Helm",

booktitle = "Proceedings of the Twenty Second European Photovoltaic Solar Energy Conference (22E-PVSEC)",

note = "22nd European Photovoltaic Solar Energy Conference 2007 (22E-PVSEC), 22E-PVSEC ; Conference date: 03-09-2007 Through 07-09-2007",

url = "https://cordis.europa.eu/event/id/27506-european-photovoltaic-solar-energy-conference, https://www.eupvsec.org/index.php/conference/authors-workstation?view=article&id=287&catid=31",

}

Bellet, D, Bellet-Almaric, E, Hanley, T, Huang, S, Cho, EC, Pink, E, Scardera, G, Conibeer, G, König, D & Green, MA 2007, Structural Properties of Tin-precipitates in Sio 2 Matrix for Third Generation Photovoltaics: A Small Angle X-Ray Scattering Investigation (poster). in G Willecke, H Ossenbrink & P Helm (eds), Proceedings of the Twenty Second European Photovoltaic Solar Energy Conference (22E-PVSEC): 3-7 September 2007, Milan, Italy., 1CV.2.24, pp. 477-480, 22nd European Photovoltaic Solar Energy Conference 2007 (22E-PVSEC), Milan, Italy, 3/09/07. <https://www.researchgate.net/publication/319852158_STRUCTURAL_PROPERTIES_OF_TIN-PRECIPITATES_IN_SIO_2_MATRIX_FOR_THIRD_GENERATION_PHOTOVOLTAICS_A_SMALL_ANGLE_X-RAY_SCATTERING_INVESTIGATION>

Structural Properties of Tin-precipitates in Sio 2 Matrix for Third Generation Photovoltaics: A Small Angle X-Ray Scattering Investigation (poster). / Bellet, D; Bellet-Almaric, E. ; Hanley, T. et al.
Proceedings of the Twenty Second European Photovoltaic Solar Energy Conference (22E-PVSEC): 3-7 September 2007, Milan, Italy. ed. / G. Willecke; Heinz Ossenbrink; Peter Helm. 2007. p. 477-480 1CV.2.24.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Structural Properties of Tin-precipitates in Sio 2 Matrix for Third Generation Photovoltaics: A Small Angle X-Ray Scattering Investigation (poster)

AU - Bellet, D

AU - Bellet-Almaric, E.

AU - Hanley, T.

AU - Huang, S

AU - Cho, E.C.

AU - Pink, E

AU - Scardera, G

AU - Conibeer, G

AU - König, D

AU - Green, M.A.

PY - 2007/9/7

Y1 - 2007/9/7

N2 - This paper reports on the investigation of Third Generation Photovoltaics multilayers by using small angle X-ray scattering (SAXS). This method is well suited to get information concerning the size, the shape and its distribution of nano-particles after crystallisation. Data show a strong effect of the sample annealing on the SAXS intensity in agreement with a change in the microstructure. A first and simple data analysis (Guinier plot) of the data enables to get an average particles size. The comparison with Glancing Incident X-ray Diffraction data leads to a rather good agreement. The obtained particle size is much higher than the tin-rich SiO2 layer, suggesting that the 6 nm SiO2 layer is not efficient enough to stop the crystallisation at the interfaces.

AB - This paper reports on the investigation of Third Generation Photovoltaics multilayers by using small angle X-ray scattering (SAXS). This method is well suited to get information concerning the size, the shape and its distribution of nano-particles after crystallisation. Data show a strong effect of the sample annealing on the SAXS intensity in agreement with a change in the microstructure. A first and simple data analysis (Guinier plot) of the data enables to get an average particles size. The comparison with Glancing Incident X-ray Diffraction data leads to a rather good agreement. The obtained particle size is much higher than the tin-rich SiO2 layer, suggesting that the 6 nm SiO2 layer is not efficient enough to stop the crystallisation at the interfaces.

KW - Characterization

KW - Nanoparticles

KW - Small Angle X-ray Scattering (SAXS)

M3 - Conference contribution

SP - 477

EP - 480

BT - Proceedings of the Twenty Second European Photovoltaic Solar Energy Conference (22E-PVSEC)

A2 - Willecke, G.

A2 - Ossenbrink, Heinz

A2 - Helm, Peter

T2 - 22nd European Photovoltaic Solar Energy Conference 2007 (22E-PVSEC)

Y2 - 3 September 2007 through 7 September 2007

ER -

Bellet D, Bellet-Almaric E, Hanley T, Huang S, Cho EC, Pink E et al. Structural Properties of Tin-precipitates in Sio 2 Matrix for Third Generation Photovoltaics: A Small Angle X-Ray Scattering Investigation (poster). In Willecke G, Ossenbrink H, Helm P, editors, Proceedings of the Twenty Second European Photovoltaic Solar Energy Conference (22E-PVSEC): 3-7 September 2007, Milan, Italy. 2007. p. 477-480. 1CV.2.24

Structural Properties of Tin-precipitates in Sio 2 Matrix for Third Generation Photovoltaics: A Small Angle X-Ray Scattering Investigation (poster)

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Conference

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