Structural stability of Cu nanocrystals in SiO2 exposed to high-energy ion irradiation

B. Johannessen; P. Kluth; C. J. Glover; S. M. Kluth; G. J. Foran; D. J. Cookson; D. J. Llewellyn; M. C. Ridgway

doi:10.1016/j.nimb.2006.04.112

Structural stability of Cu nanocrystals in SiO₂ exposed to high-energy ion irradiation

B. Johannessen^*, P. Kluth, C. J. Glover, S. M. Kluth, G. J. Foran, D. J. Cookson, D. J. Llewellyn, M. C. Ridgway

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

Cu nanocrystals (NCs) were synthesized in SiO₂ by ion implantation and thermal annealing. Annealing at two different temperatures of 950 °C and 650 °C yielded two different nanocrystal size distributions with an average diameter of 8.1 and 2.5 nm, respectively. Subsequently the NCs were exposed to 5.0 MeV Sn³⁺ ion irradiation simultaneously with a thin Cu film as a bulk reference. The short-range atomic structure and average NC diameter was measured by means of extended X-ray absorption fine structure (EXAFS) spectroscopy and small angle X-ray scattering (SAXS), respectively. Consistent with the high regeneration rate of bulk elemental metals, no irradiation induced defects were observed for the reference, whereas the small NCs (2.5 nm) were dissolved as Cu monomers in the matrix. The latter was attributed to irradiation-induced mixing of Cu, Si and O based on dynamic binary collision simulations. For the large NCs (8.1 nm) only minor structural changes were observed upon irradiation, consistent with a more bulk-like pre-irradiation structure.

Original language	English
Pages (from-to)	210-214
Number of pages	5
Journal	Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume	250
Issue number	1-2 SPEC. ISS.
DOIs	https://doi.org/10.1016/j.nimb.2006.04.112
Publication status	Published - Sept 2006

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Johannessen, B., Kluth, P., Glover, C. J., Kluth, S. M., Foran, G. J., Cookson, D. J., Llewellyn, D. J., & Ridgway, M. C. (2006). Structural stability of Cu nanocrystals in SiO₂ exposed to high-energy ion irradiation. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 250(1-2 SPEC. ISS.), 210-214. https://doi.org/10.1016/j.nimb.2006.04.112

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title = "Structural stability of Cu nanocrystals in SiO2 exposed to high-energy ion irradiation",

abstract = "Cu nanocrystals (NCs) were synthesized in SiO2 by ion implantation and thermal annealing. Annealing at two different temperatures of 950 °C and 650 °C yielded two different nanocrystal size distributions with an average diameter of 8.1 and 2.5 nm, respectively. Subsequently the NCs were exposed to 5.0 MeV Sn3+ ion irradiation simultaneously with a thin Cu film as a bulk reference. The short-range atomic structure and average NC diameter was measured by means of extended X-ray absorption fine structure (EXAFS) spectroscopy and small angle X-ray scattering (SAXS), respectively. Consistent with the high regeneration rate of bulk elemental metals, no irradiation induced defects were observed for the reference, whereas the small NCs (2.5 nm) were dissolved as Cu monomers in the matrix. The latter was attributed to irradiation-induced mixing of Cu, Si and O based on dynamic binary collision simulations. For the large NCs (8.1 nm) only minor structural changes were observed upon irradiation, consistent with a more bulk-like pre-irradiation structure.",

keywords = "EXAFS, Ion implantation, Nanocrystals, SAXS",

author = "B. Johannessen and P. Kluth and Glover, {C. J.} and Kluth, {S. M.} and Foran, {G. J.} and Cookson, {D. J.} and Llewellyn, {D. J.} and Ridgway, {M. C.}",

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Johannessen, B, Kluth, P, Glover, CJ, Kluth, SM, Foran, GJ, Cookson, DJ, Llewellyn, DJ & Ridgway, MC 2006, 'Structural stability of Cu nanocrystals in SiO₂ exposed to high-energy ion irradiation', Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, vol. 250, no. 1-2 SPEC. ISS., pp. 210-214. https://doi.org/10.1016/j.nimb.2006.04.112

TY - JOUR

T1 - Structural stability of Cu nanocrystals in SiO2 exposed to high-energy ion irradiation

AU - Johannessen, B.

AU - Kluth, P.

AU - Glover, C. J.

AU - Kluth, S. M.

AU - Foran, G. J.

AU - Cookson, D. J.

AU - Llewellyn, D. J.

AU - Ridgway, M. C.

PY - 2006/9

Y1 - 2006/9

N2 - Cu nanocrystals (NCs) were synthesized in SiO2 by ion implantation and thermal annealing. Annealing at two different temperatures of 950 °C and 650 °C yielded two different nanocrystal size distributions with an average diameter of 8.1 and 2.5 nm, respectively. Subsequently the NCs were exposed to 5.0 MeV Sn3+ ion irradiation simultaneously with a thin Cu film as a bulk reference. The short-range atomic structure and average NC diameter was measured by means of extended X-ray absorption fine structure (EXAFS) spectroscopy and small angle X-ray scattering (SAXS), respectively. Consistent with the high regeneration rate of bulk elemental metals, no irradiation induced defects were observed for the reference, whereas the small NCs (2.5 nm) were dissolved as Cu monomers in the matrix. The latter was attributed to irradiation-induced mixing of Cu, Si and O based on dynamic binary collision simulations. For the large NCs (8.1 nm) only minor structural changes were observed upon irradiation, consistent with a more bulk-like pre-irradiation structure.

AB - Cu nanocrystals (NCs) were synthesized in SiO2 by ion implantation and thermal annealing. Annealing at two different temperatures of 950 °C and 650 °C yielded two different nanocrystal size distributions with an average diameter of 8.1 and 2.5 nm, respectively. Subsequently the NCs were exposed to 5.0 MeV Sn3+ ion irradiation simultaneously with a thin Cu film as a bulk reference. The short-range atomic structure and average NC diameter was measured by means of extended X-ray absorption fine structure (EXAFS) spectroscopy and small angle X-ray scattering (SAXS), respectively. Consistent with the high regeneration rate of bulk elemental metals, no irradiation induced defects were observed for the reference, whereas the small NCs (2.5 nm) were dissolved as Cu monomers in the matrix. The latter was attributed to irradiation-induced mixing of Cu, Si and O based on dynamic binary collision simulations. For the large NCs (8.1 nm) only minor structural changes were observed upon irradiation, consistent with a more bulk-like pre-irradiation structure.

KW - EXAFS

KW - Ion implantation

KW - Nanocrystals

KW - SAXS

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U2 - 10.1016/j.nimb.2006.04.112

DO - 10.1016/j.nimb.2006.04.112

M3 - Article

SN - 0168-583X

VL - 250

SP - 210

EP - 214

JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

IS - 1-2 SPEC. ISS.

ER -

Structural stability of Cu nanocrystals in SiO₂ exposed to high-energy ion irradiation

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